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A Fast Algorithm for Fundamental Parameter Calculations

Published online by Cambridge University Press:  06 March 2019

Ch. Pöhn  and
H. Ebel
Ch. Pöhn
Affiliation:
Institut für Angewandte und Technische Physik Technische Universitát Wien, A 1040 Wien, Austria
H. Ebel
Affiliation:
Institut für Angewandte und Technische Physik Technische Universitát Wien, A 1040 Wien, Austria
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Abstract

A fundamental parameter algorithm for quantitative XFA with characteristic Kα- and Lα-radiations of the specimens is presented. This allows an application to programmable pocket calculators or a fast evaluation of measured countrates for the unknown composition of the specimen by means of PCs. For the practical utilization we need the incidence angle and the takeoff angle of the x-rays in the instrument, the high voltage V in kV which is supplied to the x-ray tube (E0) and reference measurements on either pure elements or a single reference specimen. The quality of the analytical results depends on the concentration differences of the unknown specimen and the reference specimen.

Type
X. Mathematical Methods in X-Ray Spectrometry (XRS)
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 715 - 720
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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