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Comparison of Synchrotron X-Ray Microanalysis with Electron and Proton Microscopy for Individual Particle Analysis

Published online by Cambridge University Press:  06 March 2019

K.H. Janssens ,
F. van Langevelde ,
F.C. Adams ,
R.D. Vis ,
S.R. Sutton ,
M.L. Rivers ,
K.W. Jones  and
D.K. Bowen
K.H. Janssens
Affiliation:
Department of Chemistry, University of Antwerp (U.I.A.) Universiteitsplein 1, B-261G Wilrijk/Antwerp, Belgium
F. van Langevelde
Affiliation:
Department of Chemistry, University of Antwerp (U.I.A.) Universiteitsplein 1, B-261G Wilrijk/Antwerp, Belgium
F.C. Adams
Affiliation:
Department of Chemistry, University of Antwerp (U.I.A.) Universiteitsplein 1, B-261G Wilrijk/Antwerp, Belgium
R.D. Vis
Affiliation:
Department of Physics and Astronomy, Free University of Amsterdam, P.O. Box 7161, 1007 MC Amsterdam, The Netherlands
S.R. Sutton
Affiliation:
Department of Applied Science, Brookhaven National Laboratories, Upton, NY 11973, USA
M.L. Rivers
Affiliation:
Department of Applied Science, Brookhaven National Laboratories, Upton, NY 11973, USA
K.W. Jones
Affiliation:
Department of Applied Science, Brookhaven National Laboratories, Upton, NY 11973, USA
D.K. Bowen
Affiliation:
Department of Electrical Engineering, University of Warwick Coventry CV4 7AL, Great Britain
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Extract

A considerable number of the elements and a profusion of organic compounds are emitted into the atmosphere in association with solid and liquid particles. More than 50 percent of all air pollutants are preferentially present in particulate matter rather than in the gas phase. The assessment of the potential environmental and toxic effects of particulate matter in the atmosphere requires a detailed physical and chemical characterization. Methods for analyzing aerosols have recently been extensively reviewed by Maenhaut.

Type
XV. X-Ray Imaging and Tomography
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 1265 - 1273
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Maenhaut, W., in “Controle and Fate of Atmospheric Trace Metals,” J.M. Pacyna, B. Ottar, eds., Kluwer Academic Publishers, New York (1989).Google Scholar
2. Gray, A. L., in, “Inorganic Mass Spectrometry”, F. Adams, R. Gijkels, R. Van Grieken, eds., Wiley, New York (1988).Google Scholar
3. Fox, D. L., Anal. Chem., 59:280R (1987).10.1021/ac00139a015Google Scholar
4. Allan, A., Sansoni, B., J. Radioanal. Nucl. Chem., 89: 191 (1985).10.1007/BF02070215Google Scholar
5. Maenhaut, W., Anal. Chim. Acta, 195: 123 (1987).10.1016/S0003-2670(00)85655-XGoogle Scholar
6. Van Grieken, R. E., Labreque, J. J., in “Trace Analysis”, Vol. 4, J.F. Lawrence, ed., Academic Press, New York (1985).Google Scholar
7. Spurny, K. R., (ed,), “Physical and Chemical Characterisation of Individual Airborne Particles”, Ellis Horwood, Chichester, UK (1985).Google Scholar
8. Janssens, K., Van Borm, W. and Van Espen, P., NBS J. Res., 93: 260 (1988).10.6028/jres.093.037Google Scholar
9. Sie, S. H., Ryan, C. G., Cousens, D. R., Griffin, W. L., Nucl. Instr. Meth., 840/41: 690 (1989) .10.1016/0168-583X(89)91076-8Google Scholar
10. Kaufmann, R., Hillenkamp, F., Wechsung, R., Heinen, H. J., M. Schürrnann, in “Scanning Electron Microscopy”, Vol. II, SEM Inc., A.M.F. O'Hare, IL 60666, USA, (1979).Google Scholar
11. Cholewa, M., Bench, G., Kriby, B., Legge, G. F. J, Nucl. Instr. Meth. B, 1990, in press.Google Scholar
12. Hanson, A. L., Kraner, H. W., Jones, K. W., Gordon, B. M., Mills, R. E., Chen, J. R., IEEE Trans. Nucl. Sci., NS-30: 1339 (1983).10.1109/TNS.1983.4332526Google Scholar
13. Jones, K. W, Gordon, B. M, Hanson, A. L., Hastings, J. B., M. R, Howells, Kraner, H. W., Chen, J. R., Nucl. Instr. Meth., B3: 225 (1984).10.1016/0168-583X(84)90367-7Google Scholar
14. Bos, A. J. J., Vis, R. D., Verheul, H., Prins, M., Davies, S. T., Bowen, D. K., Makjanic, J., Valkovic, V., Nucl Instr, Meth., B3: 232 (1984).10.1016/0168-583X(84)90368-9Google Scholar
15. van Langevelde, F., vis, R. D.. Anal. Chem., accepted (1991).Google Scholar
16. Baryshev, V. B., Kulipanov, G. N., Zavtsev, E. I., Terekhov, Y. V., Kalyuzny, V, I., Nucl. Instr. Meth., A261: 279 (1987).10.1016/0168-9002(87)90616-4Google Scholar
17. Torok, S., Szokefalvi-Nagy, Z., Sandor, S., Baryshev, V. B, Zolotarev, K. V., Kulipanov, G. N., Nucl. Instr, Meth., A282: 499 (1989).10.1016/0168-9002(89)90032-6Google Scholar
18. Jones, K. W, Gordon, B. M., Anal. Chem., 61:341A (1989).10.1021/ac00180a719Google Scholar
19. Ketelsen, P., Kndchel, A., Petersen, W., Z. Anal. Chem., 323: 867 (1986),10.1007/BF00475761Google Scholar
20. van Langevelde, F., Bowen, D. K., Tros, G. H. J., Vis, R. D., Huizing, A., DKG de Boer, Nucl. Instr. Meth., A292: 719 (1990).10.1016/0168-9002(90)90193-AGoogle Scholar
21. Underwood, J. H, Thompson, A. C., Wu, Y., Giauque, R. D., Nucl. Instr. Meth., A266: 296 (1988).10.1016/0168-9002(88)90400-7Google Scholar
22. Goshi, Y., Aoki, S., Iida, A., Hayakawa, S., Yamaij, H., Sakurai, K., Jpn. J. Appl. Phys., 26:L1260 (1987).Google Scholar
23. Small, J. A., Heinrich, K. F. J., Fiori, C. E., Myklebust, R, L., Newbury, D. E., Dilmore, M. F., in “Scanning Electron Microscopy”, Vol. 1, SEM Inc, AMF O'Hare, IL, USA (1987).Google Scholar
24. Vis, R. D., Fres. J. Anal. Chem., 337: 622 (1990).10.1007/BF00323096Google Scholar
25. Jenkins, R., Spectrochimica Acta, 37: 207 (1982).10.1016/0584-8547(82)80061-XGoogle Scholar