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Analysis of X-Ray Diffraction Data for the Characterization of Residual Stress

Published online by Cambridge University Press:  06 March 2019

Jun S. Park  and
James F. Shackelford
Jun S. Park
Affiliation:
Department of Mechanical, Aeronautical and Materials Engineering University of California, Davis, CA 95616
James F. Shackelford
Affiliation:
Department of Mechanical, Aeronautical and Materials Engineering University of California, Davis, CA 95616
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Abstract

The analysis of linear dϕψ vs sin2ψ x-ray diffraction data in isotropic single phase materials was investigated for the evaluation of x-ray elastic constants. This study developed an experimental model for estimating x-ray elastic constants based on the analysis of biaxial residual stress states, A ball bearing steel and a 1018 steel weldment were evaluated.

In a second study, the measurement of residual stress gradients was evaluated for those depth ranges mat can not be evaluated with a single radiation. This requires various planes and radiation energies to obtain the simultaneous conditions of high diffraction angle and large x-ray penetration depth. The evaluation of the overlapped stress gradient region is illustrated in terms of x-ray energy and diffraction angle for the ease of iron. This analysis is specifically developed for the purpose of stress gradient measurement using synchrotron radiation.

Type
VII. Stress Determination by Diffraction Methods
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 561 - 569
Copyright
Copyright © International Centre for Diffraction Data 1991

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