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Topological and metric changes during tessellation evolution in two dimensional grain growth

Published online by Cambridge University Press:  01 July 2016

Robert. T. Dehoff
Robert. T. Dehoff*
Affiliation:
University of Florida
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Abstract

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Type
Papers
Information
Advances in Applied Probability , Volume 30 , Issue 2 , June 1998 , pp. 277 - 278
Copyright
Copyright © Applied Probability Trust 1998 

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References

[1] Fradkov, V.E. and Udler, D. (1994). Two dimensional normal grain growth: topological aspects. Advances in Physics 43, 739–789.CrossRefGoogle Scholar
[2] VON Neumann, J. (1956). Grains, phases and interfaces. In Metal Interfaces. American Society for Metals, Metals Park, OH. pp. 109–111.Google Scholar