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2 - X-parameters – fundamental concepts

Published online by Cambridge University Press:  05 October 2013

David E. Root ,
Jan Verspecht ,
Jason Horn  and
Mihai Marcu
David E. Root
Affiliation:
Agilent Technologies
Jan Verspecht
Affiliation:
Agilent Technologies
Jason Horn
Affiliation:
Agilent Technologies
Mihai Marcu
Affiliation:
Agilent Technologies
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X-Parameters
Characterization, Modeling, and Design of Nonlinear RF and Microwave Components
 , pp. 20 - 44
Publisher: Cambridge University Press
Print publication year: 2013

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References

Verspecht, J., “Describing functions can better model hard nonlinearities in the frequency domain than the Volterra theory,” Ph.D. thesis annex, Vrije Univ. Brussel, Belgium, Nov. 1995; available at .
Kundert, K., The Designer's Guide to SPICE and Spectre®. Norwell, MA: Kluwer Academic Publishers, 1995.Google Scholar
Root, D. E., Horn, J., Nielsen, T., et al., “X-parameters: the emerging paradigm for interoperable characterization, modeling, and design of nonlinear microwave and RF components and systems,” in IEEE Wamicon2011 Tutorial, Clearwater, FL, Apr. 2011.Google Scholar
Root, D. E., Verspecht, J., Sharrit, D., Wood, J., and Cognata, A., “Broad-band, poly-harmonic distortion (PHD) behavioral models from fast automated simulations and large-signal vectorial network measurements,” IEEE Trans. Microw. Theory Tech., vol. 53, no. 11, pp. 3656–3664, Nov. 2005.CrossRefGoogle Scholar
Verspecht, J. and Root, D. E., “Poly-harmonic distortion modeling,” IEEE Microwave, vol. 7, no. 3, pp. 44–57, June 2006.CrossRefGoogle Scholar

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