Behavioral modeling

Patrick Roblin

doi:10.1017/CBO9780511862663.008

6 - Behavioral modeling

Published online by Cambridge University Press: 05 July 2011

Patrick Roblin

Show author details

Patrick Roblin: Affiliation:
Ohio State University

Book contents

Get access

Summary

Behavioral model for SISO and MIMO systems

In this chapter we will discuss various new techniques for the behavioral modeling of devices characterized by NVNA and VSA measurements. The reader is referred to the companion series book [1] for a comprehensive review of the field of behavioral modeling.

In our presentation we will focus on the development of single-input single-output (SISO) models. As shown in Figure 6.1(a) SISO models can be directly applied to single-port (two terminals) nonlinear loads or diodes. An example is the nonlinear negative resistance of an oscillator, which will be discussed in Chapter 7.

For the modeling of power amplifiers that are two-port devices (four terminals) a SISO model as shown in Figure 6.1(a) can be applied if we assume that the input and output ports are matched. That way, none of the reflected waves at the input b1(pω) from the device is converted into incident waves a1(pω) at port 1 and similarly none of the transmitted waves b2(pω) is converted into incident waves a2(pω) at port 2. A SISO model can also be applied to three-port modulator systems under similar approximations, as we shall see in Chapter 8.

The matching of the generator impedance and output load impedance to the characteristic impedance (typically 50 Ω) can be improved in practical systems by inserting attenuators or isolators at the input and output ports. Obviously, in the real world no device is perfect and some small reflections will still take place.

Type: Chapter
Information: Nonlinear RF Circuits and Nonlinear Vector Network Analyzers
Interactive Measurement and Design Techniques
, pp. 160 - 200

DOI: https://doi.org/10.1017/CBO9780511862663.008 [Opens in a new window]

Publisher: Cambridge University Press

Print publication year: 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] K., Kurokawa, Microwave Solid State Oscillator Circuits, 2nd edition, Addison-Wesley, 1968.Google Scholar

[2] K., Kurokawa, “Noise in synchronized oscillators,” IEEE Transactions on Microwave Theory and Techniques, Vol. 16, No. 4, pp. 234–240, April 1968.Google Scholar

[3] J., Mukherjee, P., Roblin, and S., Bibyk, “An analytic circuit-based model for white and flicker phase noise in LC oscillators,” IEEE Transactions on Circuits and Systems, Vol. 54, No. 7, pp. 1584–1598, July 2007.Google Scholar

[4] W., Wagner, “Oscillator design by device line measurement,” Microwave Journal, Vol. 22, No. 2, p. 43, Feb. 1979.Google Scholar

[5] M., Vehovec, L., Houselander, and R., Spence, “On oscillator design for maximum power,” IEEE Transactions on Circuits and Systems, Vol. 15, No. 3, pp. 281–283, Mar. 1968.Google Scholar

[6] V. M. T., Lam, P. C. L., Yip, and C. R., Poole, “Microwave oscillator design with power prediction,” Electronics Letters, Vol. 27, No. 17, pp. 1574–1575, Sept. 1991.Google Scholar

[7] P., Berini, M., Desgagne, F. M., Ghannouchi, and R. G., Bosisio, “An experimental study of the effects of harmonic loading on microwave MESFET oscillators and amplifiers,” IEEE Transactions on Microwave Theory and Techniques, Vol. 42, No. 6, pp. 943–950, June 1994.Google Scholar

[8] I., Suh, S. J., Doo, P., Roblin, X., Cui, Y. G., Kim, J., Strahler, M., Vanden Bossche, R., Rojas, and H. D., Park, “Negative input resistance and real-time active loadpull measurements of a 2.5 GHz oscillator using an LSNA,” in 69th ARFTG Conference Digest, Honolulu, HI, June 2007.Google Scholar

[9] I., Suh, P., Roblin, S. J., Doo, X., Cui, J., Strahler, and R. G., Rojas, “Measurement-based methodology to design harmonic loaded oscillators using real-time active load-pull,” IET Microwaves, Antennas & Propagation, Vol. 5, No. 1, pp. 77–83, 2011.Google Scholar

[10] F. X., Kaertner, “Analysis of white and f-α noise in oscillators,” International Journal of Circuit Theory and Applications, Vol. 18, No. 5, pp. 485–519, Sept. 1990.Google Scholar

[11] J., Roychowdhury, A., Demir, and A., Mehrotra, “Phase noise in oscillators: a unifying theory and numerical methods for characterization,” IEEE Transactions on Circuits and Systems I, Vol. 47, No. 4, pp. 655–674, May 2000.Google Scholar

[12] A., Demir, “Phase noise and timing jitter in oscillators with colored-noise sources,” IEEE Transactions on Circuits and Systems I, Vol. 49, No. 12, pp. 1782–1791, Dec. 2002.Google Scholar

[13] S., Sancho, A., Suárez, J., Domínguez, and F., Ramírez, “Analysis of near-carrier phase-noise spectrum in free-running oscillators in the presence of white and colored noise sources,” IEEE Transactions on Microwave Theory and Techniques, Vol. 58, No. 3, pp. 587–601, Mar. 2010.Google Scholar

[14] A., Hajimiri and T. H., Lee, “A general theory of phase noise in electrical oscillators,” IEEE Journal of Solid-State Circuits, Vol. 33, No. 2, pp. 179–194, 1998.Google Scholar

[15] P., Penfield, “Circuit theory of periodically driven nonlinear systems,” Proceedings of the IEEE, Vol. 54, No. 2, pp. 266–280, Feb. 1966.Google Scholar

[16] V., Rizzoli, F., Mastri, and D., Masotti, “General noise analysis of nonlinear microwave circuits by the piecewise harmonic balance technique,” IEEE Transactions on Microwave Theory and Techniques, Vol. 42, No. 5, pp. 807–819, May 1994.Google Scholar

[17] A. S., Roy and C. C., Enz, “Analytical modeling of large-signal cyclo-stationary lowfrequency noise with arbitrary periodic input,” IEEE Transactions on Electron Devices, Vol. 54, No. 9, pp. 2537–2545, Sept. 2007.Google Scholar

[18] A., Papoulis, Probability, Random Variables, and Stochastic Processes, 2nd edition, McGraw Hill, 1984.Google Scholar

[19] E. S., Ferre-Pikal, J. R., Vig, J. C., Camparo, L. S., Cutler, L., Maleki, W. J., Riley, S. R., Stein, C., Thomas, F. L., Walls, and J. D., White, “Draft revision of IEEE STD 1139-1988 standard definitions of physical quantities for fundamental frequency theory and applications,” in Proceedings of the IEEE International Frequency Control Symposium, pp. 338–357, 1997.Google Scholar

[20] D. B., Leeson, “A simple model of feedback oscillator noise spectrum,” Proceedings of the IEEE, Vol. 54, No. 2, pp. 329–330, Feb. 1966.Google Scholar

[21] J., Bank, “A Harmonic-Oscillator Design Methodology Based on Describing Functions,” Dissertation, Doctor of Philosophy, Chalmers University of Technology, 2006.

[22] H., Rohdin, Chung-Yi, Su, and C., Stolte, “A study of the relation between device lowfrequency noise and oscillator phase noise for GaAs MESFETs,” in IEEE Microwave Symposium Digest, pp. 267–269, 1984.Google Scholar

[23] L. M., Nelson, C. W., Nelson, and F. L., Walls, “Relationship of AM to PM noise in selected RF oscillators,” IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, Vol. 41, No. 5, pp. 680–684, Sept. 1994.Google Scholar

[24] E., Rubiola, Phase Noise and Frequency Stability in Oscillators, Cambridge University Press, 2009.Google Scholar

[25] I., Suh, P., Roblin, and H., Jang, “Generalized Van Der Pol Oscillator for 1/f Noise,” unpublished.

[26] F., Ramírez, M., Pontón, S., Sancho, and A., Suárez, “Phase-noise analysis of injection-locked oscillators and analog frequency dividers,” IEEE Transactions on Microwave Theory and Techniques, Vol. 56, No. 2, pp. 393–407, Feb. 2008.Google Scholar

[27] R., Adler, “A study of locking phenomena in oscillators,” Proceedings of the IEEE, Vol. 61, No. 10, pp. 1380–1385, Oct. 1973.Google Scholar

Book contents

6 - Behavioral modeling

Summary

Access options

References

Save book to Kindle

Save book to Dropbox

Save book to Google Drive