Preparing cross sections of particulates and wires for scanning electron microscopy study without inducing mechanical damage is difficult. Embedding materials in commercially available epoxy before polishing with a broad unfocused ion beam is a simple and inexpensive way to produce a cross section with minimal preparation artifacts. A stepwise procedure is provided for embedding and polishing powders, larger particles, and wires.

Nano-nozzles are an essential part of the nano electromechanical systems (NEMS). Cross-sectional geometry of nano-nozzles has a significant role on the fluid flow inside them. So, main purpose of the present study is related to the effects of different symmetrical cross-sections on the fluid flow behavior inside of nano-nozzles. To this accomplishment, five different cross-sectional geometries (equilateral triangle, square, regular hexagon, elliptical and circular) are investigated by using molecular dynamics (MD) simulation. In addition, TIP4P is used for atomistic water model. In order to evaluate the fluid flow behavior, non-dimensional physical parameters such as Fanning friction factor, velocity profile and density number are analyzed. Obtained results are shown that the flow behavior characteristics appreciably depend on the geometry of nano-nozzle's cross-section. Velocity profile and density number for five different cross sections of nano-nozzle at three various measurement gauges are presented and discussed.

The article presents a review of the use of cross-section and staining techniques for investigating natural organic materials (mainly proteinaceous and oil-based binders/varnishes) in painted and polychrome artworks, considering the requirements of conservation practice and routine diagnostics. The reviewed literature calls attention to the importance of using cross sections to prepare samples for optical microscopy and to different properties of embedding resins; the most appropriate instrumental conditions for optical microscopy; and the advantages and disadvantages of the most common staining techniques. A few case studies were selected to illustrate the use of autofluorescence (intrinsic fluorescence) and induced fluorescence (using specific staining tests and fluorophore-labeled antibodies) for mapping and identifying organic paint materials in cross sections. New directions of research in cross-section analyses and fluorescence-based techniques for the identification and mapping of artistic materials are presented. The complementary use of different stains on the same cross section, further exploration of intrinsic and induced fluorescence of aged versus fresh materials, and applicability of cross-section observation and staining as complementary methods for assessing the effectiveness of restoration treatments, such as cleaning and consolidation, are discussed in the last section of the article.

We have developed the focused ion beam (FIB) fold-out technique, for transmission electron microscopy (TEM) sample preparation in which there is no fine polishing or dimpling, thus saving turnaround time. It does not require a nanomanipulator yet is still site specific. The sample wafer is cut to shape, polished down, and then placed in a FIB system. A tab containing the area of interest is created by ion milling and then “folded out” from the bulk sample. This method also allows a plan-view of the sample by removing material below the wafer's surface film or device near the polished edge. In the final step, the sample is thinned to electron transparency, ready to be analyzed in the TEM. With both a cross section and plan-view, our technique gives microscopists a powerful tool in analyzing multiple zone axes in one TEM session. The nature of the polished sample edge also includes the ability to sample many areas, allowing the user to examine a very large device or sample. More importantly, this technique could make multiple site-specific e-beam transparent specimens in one polished sample, which is difficult to do when prepared by other methods.

A method for preparing a cross-section sample from a free-standing thin-film coupon suitable for transmission electron microscopy analysis has been successfully developed. The free-standing coupon presented a significant challenge for the preparation of a cross-section sample. A stack consisting of a silicon wafer, thin-film coupon, and glass coverslip was epoxied together, providing both support for thin film and enough surface area to handle the specimen during the sample preparation procedure. The tripod polisher wedge technique was used to thin the cross-section sample to 2 to 5 μm in thickness. This produced a sample with the required structural integrity. Final thinning was accomplished using an ion mill. This technique showed no artifacts introduced from the sample preparation procedure.