30 results
In situ Transmission Electron Microscopy of Room-temperature Plastic Deformation and Recovery in Thin 3C-SiC
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1834-1835
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- August 2018
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Fluctuation Electron Microscopy Study of Medium-Range Packing Order in Ultrastable Indomethacin Glass Thin Films
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- MRS Online Proceedings Library Archive / Volume 1757 / 2015
- Published online by Cambridge University Press:
- 05 February 2015, mrsf14-1757-uu05-04
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- 2015
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When is Z-Contrast D-Contrast?
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- Microscopy Today / Volume 22 / Issue 1 / January 2014
- Published online by Cambridge University Press:
- 21 January 2014, p. 65
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- January 2014
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Medium-range Order of Zr54Cu38Al8 Bulk Metallic Glass
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- MRS Online Proceedings Library Archive / Volume 1649 / 2014
- Published online by Cambridge University Press:
- 22 January 2014, mrsf13-1649-ii08-09
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- 2014
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Absence of Lateral Composition Fluctuations in Aberration-corrected STEM Images of an InGaN Quantum Well at Low Dose
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- MRS Online Proceedings Library Archive / Volume 1432 / 2012
- Published online by Cambridge University Press:
- 16 May 2012, mrss12-1432-g04-03
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- 2012
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Angular Correlations in Coherent Electron Nanodiffraction of a Metallic Glass
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1110-1111
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- July 2011
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Synthesis, Structure, and Morphology of Magnetic Core-Shell Nanoparticles
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1428-1429
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- July 2011
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Effect of Doping on the Structural and Optical Properties of Microwave-Assisted Synthesis of ZnSe@ZnS Core-Shell Quantum Dots
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- MRS Online Proceedings Library Archive / Volume 1207 / 2009
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- 31 January 2011, 1207-N10-61
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- 2009
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The Electron Microscopy Database: A Resource for Teaching and Learning Quantitative Methods in Electron Microscopy and Spectroscopy
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1730-1731
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- August 2007
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Measuring the Characteristic Length Scale of Medium Range Order in Amorphous Silicon Using Variable Resolution Fluctuation Electron Microscopy
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 722-723
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- August 2005
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Confocal Scanning Transmission Electron Microscopy: Theoretical Analysis of Three-Dimensional Imaging
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 320-321
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- August 2005
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Potential for Optical Sectioning in Aberration-Corrected Z-contrast STEM
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- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 46-47
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- August 2004
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Medium-Range Order in High Al-content Amorphous Alloys Measured by Fluctuation Electron Microscopy
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 788-789
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- August 2004
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Turning Cutting-Edge Research into Secondary Curriculum
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- MRS Online Proceedings Library Archive / Volume 861 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, PP3.3
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- 2004
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ADF-STEM Imaging of Dopants and Defect Nanoclusters in Si
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 06 August 2003, pp. 22-23
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- August 2003
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Exploring the physical limits of transistor scaling using STEM
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 01 August 2003, pp. 1012-1013
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- August 2003
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Z-Contrast Imaging of Nanostructures in the STEM
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 19 July 2003, pp. 264-265
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- August 2003
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Medium-Range Order in High Al-content Amorphous Alloys Measured by Fluctuation Electron Microscopy
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- MRS Online Proceedings Library Archive / Volume 806 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, MM9.4
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- 2003
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Imaging Single Dopant Atoms and Nanoclusters in Highly n-type Bulk Si
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1614-1615
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- August 2002
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Fluctuation Microscopy in the STEM
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 226-227
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- August 2001
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