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In situ Transmission Electron Microscopy of Room-temperature Plastic Deformation and Recovery in Thin 3C-SiC

Published online by Cambridge University Press:  01 August 2018

Xuying Liu ,
Izabela Szlufarska  and
P. M. Voyles
Xuying Liu
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, US
Izabela Szlufarska
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, US
P. M. Voyles
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, US

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1834 - 1835
Copyright
© Microscopy Society of America 2018 

References

[1] Zorman, Christian A. Parro, Rocco J., Physica Status Solidi (b) 245 2008) p. 1404–1424.Google Scholar
[2] Sarro, P. M., et al, Sens. Actuators 82 2000) p. 8–210.Google Scholar
[3] Snead, L. L., et al, J. Nucl. Mater. 371 2007) p. 77–329.Google Scholar
[4] Kiani, S, et al, Acta Materialia 80 2014) p. 400–406.Google Scholar
[5] Chen, Bin, et al, Acta Materialia 80 2014) p. 392–399.Google Scholar
[6] The author gratefully acknowledges financial support from Department of Energy, Office of Nuclear Engineering under Nuclear Engineering University Program (NEUP) Grant DE-NE0008418..Google Scholar