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Measuring the Characteristic Length Scale of Medium Range Order in Amorphous Silicon Using Variable Resolution Fluctuation Electron Microscopy

Published online by Cambridge University Press:  01 August 2005

L N Nittala ,
R D Twesten ,
P M Voyles  and
J R Abelson
L N Nittala
Affiliation:
University of Illinois Urbana Champaign
R D Twesten
Affiliation:
University of Illinois Urbana Champaign
P M Voyles
Affiliation:
University of Wisconsin
J R Abelson
Affiliation:
University of Illinois Urbana Champaign

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 722 - 723
Copyright
© 2005 Microscopy Society of America