10 results
Atomic-scale Study of a Transition Phase Precipitate and Its Interfacial Chemistry in an Fe−15 at.% Mo−5 at.% V Alloy
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue 5 / September 2001
- Published online by Cambridge University Press:
- 02 February 2002, pp. 424-434
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- September 2001
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Three-dimensional Investigation of Ceramic/Metal Heterophase Interfaces by Atom-probe Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue 5 / September 2000
- Published online by Cambridge University Press:
- 07 August 2002, pp. 445-451
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- September 2000
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Analysis of Three-dimensional Atom-probe Data by the Proximity Histogram
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue 5 / September 2000
- Published online by Cambridge University Press:
- 07 August 2002, pp. 437-444
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- September 2000
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A Subnanoscale Study of Segregation at CdO/Ag(Au) Heterophase Interfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 654 / 2000
- Published online by Cambridge University Press:
- 21 March 2011, AA4.9.1
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- 2000
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Cation sublattice stacking faults in Cu-rich chalcopyrite CuInSe2
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- Journal:
- Journal of Materials Research / Volume 11 / Issue 6 / June 1996
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1398-1402
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- June 1996
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Defect Structure of Cu-Rich and In-Rich Chalcopyrite CuInSe2 Films Grown on GaAS
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- Journal:
- MRS Online Proceedings Library Archive / Volume 399 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 467
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- 1995
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Imaging of Buried Si and Si:Ge Surface Structure Under Amorphous Ge Films by Plan View Transmission Electron Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 332 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 237
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- 1994
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Effect of Buried Surface Structure on Solid Phase Epitaxy of GE on SI (111)-7×7
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- Journal:
- MRS Online Proceedings Library Archive / Volume 317 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 47
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- 1993
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Nano-Structure Ge Formed in Thin Film SiO2 Using Ion Implantation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 316 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 475
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- 1993
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A Model for Interdiffusion at Metal Semiconductor Interfaces: Conditions for Spiking
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- Journal:
- MRS Online Proceedings Library Archive / Volume 148 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 83
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- 1989
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