2 results
Full-field X-ray Imaging, a Workhorse Microscopy Beamline at NSLS II for Material Science Researches
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 386-387
- Print publication:
- August 2019
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High-Resolution and High-Throughput Ptychography with Depth Sensitivity Using Multilayer Laue Lenses
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 28-29
- Print publication:
- August 2018
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