Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-26T18:23:17.918Z Has data issue: false hasContentIssue false
  • English
  • Français

High-Resolution and High-Throughput Ptychography with Depth Sensitivity Using Multilayer Laue Lenses

Published online by Cambridge University Press:  10 August 2018

Xiaojing Huang ,
Hande Ozturk ,
Hanfei Yan ,
Yan He ,
Mingyuan Ge ,
Zhihua Dong ,
Meifeng Lin ,
Evgeny Nazaretski ,
Petr Ilinski  and
Ian Robinson
...Show all authors
Xiaojing Huang*
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA
Hande Ozturk
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA
Hanfei Yan
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA
Yan He
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Shanghai201204, China
Mingyuan Ge
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA
Zhihua Dong
Affiliation:
Computational Science Initiative, Brookhaven National Laboratory, Upton, NY11973, USA
Meifeng Lin
Affiliation:
Computational Science Initiative, Brookhaven National Laboratory, Upton, NY11973, USA
Evgeny Nazaretski
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA
Petr Ilinski
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA
Ian Robinson
Affiliation:
Condensed Matter Physics and Materials Department, Brookhaven National Laboratory, UptonNY11973, USA London Centre for Nanotechnology, University College London, London, WC1H 0AH, UK
Yong Chu
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 28 - 29
Copyright
© Microscopy Society of America 2018 

References

[1] Maiden, A, et al, J. Opt. Soc. Am. A 29 2012 1606–1614.CrossRefGoogle Scholar
[2] Suzuki, A, et al, Phys. Rev. Lett. 112 2014 053903.CrossRefGoogle Scholar
[3] Shimomura, K, et al, Phys. Rev. B 91 2015 214114.CrossRefGoogle Scholar
[4] Shimomura, K, et al, Acta Crystallogr. A 74 2018 66–70.CrossRefGoogle Scholar
[5] Tsai, E, et al, Opt. Express 24 2016 29089–29108.CrossRefGoogle Scholar
[6] Huang, X, et al, Appl. Phys. Lett. 111 2017 023103.CrossRefGoogle Scholar
[7] Ozturk, H, et al, Optica 5(5 2018 601–607.CrossRefGoogle Scholar
[8] The authors acknowledge the Laboratory Directed Research and Development (LDRD-21690) program. This research used resources of the National Synchrotron Light Source II, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory under Contract No. DE-SC0012704.Google Scholar