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Full-field X-ray Imaging, a Workhorse Microscopy Beamline at NSLS II for Material Science Researches

Published online by Cambridge University Press:  05 August 2019

Xianghui Xiao
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA.
Mingyuan Ge
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA.
Chong Yin
Affiliation:
Ningbo Institute of Materials Technology & Engineering, Ningbo, China.
Feng Wang
Affiliation:
Sustainable Energy Technologies Department, Brookhaven National Laboratory, NY, USA.
Lijie Zou
Affiliation:
State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan, China. Department of Materials Science and Chemical Engineering, Stony Brook University, Stony Brook, NY, USA.
Fei Chen
Affiliation:
State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan, China.
Yu-chen Karen Chen-Wiegart
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA. Department of Materials Science and Chemical Engineering, Stony Brook University, Stony Brook, NY, USA.
Wah-Keat Lee*
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
Leveraging 3D Imaging and Analysis Methods for New Opportunities in Material Science
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ge, M et al. , Appl. Phys. Lett. 113 (2018), p. 083109.Google Scholar
[2]This research used resources at FXI beamline (18-ID) of the National Synchrotron Light Source-II, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory under Contract No. DE-SC0012704.Google Scholar