17 results
Synchrotron x-ray thermal diffuse scattering probes for phonons in Si/SiGe/Si trilayer nanomembranes
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- Journal:
- MRS Advances / Volume 1 / Issue 48 / 2016
- Published online by Cambridge University Press:
- 16 May 2016, pp. 3263-3268
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- 2016
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Strained Si-based Nanomembrane Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 958 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0958-L04-07
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- 2006
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Pattern Formation on Silicon-on-Insulator
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- Journal:
- MRS Online Proceedings Library Archive / Volume 859 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, JJ1.3
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- 2004
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Pattern Formation on Silicon-on-Insulator
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- Journal:
- MRS Online Proceedings Library Archive / Volume 849 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, KK1.3/JJ1.3/U1.3
- Print publication:
- 2004
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Pattern Formation on Silicon-on-Insulator
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- Journal:
- MRS Online Proceedings Library Archive / Volume 854 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, U1.3/JJ1.3/KK1.3
- Print publication:
- 2004
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Bending of Nanoscale Thin Si Film Induced by Growth of Ge Islands: Hut vs. Dome
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- Journal:
- MRS Online Proceedings Library Archive / Volume 791 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, Q6.4
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- 2003
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Spontaneous Self-Embedding of Three-Dimensional SiGe Islands
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- Journal:
- MRS Online Proceedings Library Archive / Volume 571 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 313
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- 1999
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Connection between Structure and Electronic Properties in Epitaxial Magnetic Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 570 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 141
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- 1999
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A Comparative Study of the Reflectance Difference Spectrum from Si(001) Using Reflectance Difference Spectroscopy /Low-Energy Electron Diffraction/Scanning Tunneling Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 406 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 401
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- 1995
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X-Ray Diffraction Determination of Interface Roughness in GaAs/AlxGa1-xAs Multilayers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 312 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 137
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- 1993
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Strain Relaxation and Oxide Formation on Annealed W/C Multilayers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 321 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 215
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- 1993
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Scanning Tunnelling Microscopy Investigation of Surface Morphology in the Growth of GaAs(001)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 237 / 1991
- Published online by Cambridge University Press:
- 21 February 2011, 249
- Print publication:
- 1991
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Characterization of Hollow-Cathode DC Discharge Growth of Diamond: Rotational Vibronic Emission In A CH4-H2 Discharge
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- Journal:
- MRS Online Proceedings Library Archive / Volume 162 / 1989
- Published online by Cambridge University Press:
- 26 February 2011, 163
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- 1989
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Comparison of Kinetics of TiSi2 Formation on Si(100) and Si(111)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 71 / 1986
- Published online by Cambridge University Press:
- 28 February 2011, 315
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- 1986
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Analysis of Domain-Size Distributions in Epitaxial Growth Using Leed Angular Profiles
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- Journal:
- MRS Online Proceedings Library Archive / Volume 41 / 1984
- Published online by Cambridge University Press:
- 25 February 2011, 179
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- 1984
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Phase Reeationships for Adsoreed Layers on Surfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 19 / 1982
- Published online by Cambridge University Press:
- 15 February 2011, 313
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- 1982
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Analysis of Surface Structural Defects by Low Energy Electron Diffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 10 / 1981
- Published online by Cambridge University Press:
- 15 February 2011, 227
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- 1981
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