15 results
In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates
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- Journal:
- Journal of Materials Research / Volume 16 / Issue 3 / March 2001
- Published online by Cambridge University Press:
- 26 November 2012, pp. 701-708
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- March 2001
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Comparative study of structural properties and photoluminescence in InGaN layers with a high In content
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- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 5 / Issue S1 / 2000
- Published online by Cambridge University Press:
- 13 June 2014, pp. 703-709
- Print publication:
- 2000
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Comparative Study of Structural Properties and Photoluminescence in InGaN Layers with a High in Content
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- Journal:
- MRS Online Proceedings Library Archive / Volume 595 / 1999
- Published online by Cambridge University Press:
- 03 September 2012, F99W11.38
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- 1999
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Microstructure and Sensing Properties of Cryosol Derived Nanocrystalline Tin Dioxide
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- Journal:
- MRS Online Proceedings Library Archive / Volume 536 / 1998
- Published online by Cambridge University Press:
- 09 August 2011, 389
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- 1998
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Structural studies of diamond thin films grown from dc arc plasma
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- Journal:
- Journal of Materials Research / Volume 12 / Issue 10 / October 1997
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2533-2542
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- October 1997
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Observation of Vacancy Clustering in Si Crystals During in Situ Electron Irradiation in a High Voltage Electron Microscope
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- Journal:
- MRS Online Proceedings Library Archive / Volume 404 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 189
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- 1995
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Up Close: Center for Electron Microscopy of Materials Science at the University of Antwerp
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- Journal:
- MRS Bulletin / Volume 19 / Issue 9 / September 1994
- Published online by Cambridge University Press:
- 29 November 2013, pp. 57-60
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- September 1994
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Epidemiology of Staphylococcus Aureus Infections in Patients on Hemodialysis
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- Journal:
- Infection Control & Hospital Epidemiology / Volume 15 / Issue 2 / February 1994
- Published online by Cambridge University Press:
- 02 January 2015, pp. 78-81
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- February 1994
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Hrem Study of α-Si3N4 Precipitates in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 183 / 1990
- Published online by Cambridge University Press:
- 21 February 2011, 147
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- 1990
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Fabrication of High Quality Silicide Layers by Ion Implantation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 147 / 1989
- Published online by Cambridge University Press:
- 21 February 2011, 217
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- 1989
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Simple Plan View Specimen Preparation Technique For Tem Investigation Of Semiconductors and Metals
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- Journal:
- MRS Online Proceedings Library Archive / Volume 115 / 1987
- Published online by Cambridge University Press:
- 21 February 2011, 241
- Print publication:
- 1987
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HVEM and Electrical Characterisation of SIMOX Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 107 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 129
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- 1987
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Evidence for Deformation Modulated Structures in NbTe4 and TaTe4
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- MRS Online Proceedings Library Archive / Volume 21 / 1983
- Published online by Cambridge University Press:
- 21 February 2011, 181
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- 1983
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Ordered Structures in Ti Al Alloys in the Composition Range from Ab To Ab3
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- MRS Online Proceedings Library Archive / Volume 21 / 1983
- Published online by Cambridge University Press:
- 21 February 2011, 381
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- 1983
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The use of Electron Microscopy and Electron Diffraction in the Study of Phase Transformations
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- Journal:
- MRS Online Proceedings Library Archive / Volume 21 / 1983
- Published online by Cambridge University Press:
- 21 February 2011, 85
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- 1983
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