8 results
New Electron Holographic Technique for the Measurement of Strain at the Nanoscale: Application to Electronic Devices and Multilayers
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 588-589
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- July 2010
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Energy-loss magnetic chiral dichroism (EMCD): Magnetic chiral dichroism in the electron microscope
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- Journal:
- Journal of Materials Research / Volume 23 / Issue 10 / October 2008
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2582-2590
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- October 2008
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EELS and ab-initio Simulations to Study Magnetic Devices
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- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 52-53
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- September 2007
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New Electron Energy Loss Magnetic Chiral Dichroïsm (EMCD) configuration using an aberration-corrected transmission electron microscope
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- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 48-49
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- September 2007
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Determination of the structure-factor phase in non-centrosymmetric crystals by quantitative CHEF
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- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 124-125
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- September 2007
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State of the Art in Energy Loss Magnetic Chiral Dichroism (EMCD)
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1286-1287
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- August 2007
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Determination of strain within Si1-yCy layers grown by CVD on a Si Substrate
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- MRS Online Proceedings Library Archive / Volume 1026 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 1026-C07-03
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- 2007
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Information Content in Aberration Corrected High-Resolution TEM Images
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 160-161
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- August 2006
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