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Information Content in Aberration Corrected High-Resolution TEM Images

Published online by Cambridge University Press:  31 July 2006

M Hytch ,
F Houdellier ,
E Snoeck  and
M-J Casanove
M Hytch
Affiliation:
CEMES-CNRS
F Houdellier
Affiliation:
CEMES-CNRS
E Snoeck
Affiliation:
CEMES-CNRS
M-J Casanove
Affiliation:
CEMES-CNRS
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Research Article
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 160 - 161
Copyright
© 2006 Microscopy Society of America

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