Powder Diffraction: Volume 20 -

$Published on behalf of International Centre for Diffraction Data$

Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

URL: /core/journals/powder-diffraction
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Volume 20 - June 2005

Contents

Page 9 of 11

Denver X-Ray Conference

D037 Quantitative Rietveld Analysis of Hydrated Cementitious Systems
L. Mitchell, P. Whitfield
Published online by Cambridge University Press:

20 May 2016, p. 181
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F44 Alloy Characterization and Identification Using the Rubbing Technique with Micro X-ray Fluorescence
V. Montoya, G.J. Havrilla
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20 May 2016, p. 181
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F45 Quantitative Analysis of Titanium-Rich Ores by X-ray Fluorescence
W.W. Brubaker, R.M. Martin, M.H. Headinger, T. Segers, A. Wall
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20 May 2016, p. 181
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D051 Obtaining Reliable Results by Line Broadening Analysis—Invited
D. Balzar
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20 May 2016, p. 182
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D089 X-ray Line Profile Analysis for Microstructural Characterization of Nanomaterials—Invited
I. Dragomir-Cernatescu
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20 May 2016, p. 182
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D036 Investigating the Nature of Line Broadening in Electrochemically Deintercalated Li1.2Mn0.4Ni0.3Co0.1O2
P. Whitfield, S. Niketic, Y. Le Page, I. Davidson
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20 May 2016, p. 182
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D048 Analysis of Texture and Diffraction Data from Strong Neutron Absorbers
H.M. Volz, S.C. Vogel, C.T. Necker, J.A. Roberts, A.C. Lawson, D.J. Williams, L.L. Daemen, L. Lutterotti, J. Pehl
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20 May 2016, p. 182
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D053 Crystallographic Changes in Electrically Fatigued PZT Actuators
J. Müller, S. Hooker, D. Balzar
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20 May 2016, p. 182
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D090 SRM 1979: A Nist SRM for Nano-Crystallite Size Broadening—Invited
N. Armstrong, J.P. Cline, J. Ritter, J. Bonevich
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20 May 2016, p. 182
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D003 Close Contact Penalty Functions in Direct Space Methods and Energetic Considerations in Structure Refinement
C. Liang
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20 May 2016, p. 182
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D095 Malachite-Rosasite Group: Evidence for Two Distinct Structural Types Through Rietveld Refinements
N. Perchiazzi, S. Merlino
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20 May 2016, p. 182
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C11 Standardless XRF—Invited
M. Mantler
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20 May 2016, p. 183
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F67 Optimization of Quantification Schemes for Contemporary Field-Portable XRF Analyzers—Invited
S. Piorek
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20 May 2016, p. 183
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F01 Use of the Monte Carlo Simulation Code CEARXRF for the EDXRF Inverse Problem
W. Guo, R.P. Gardner, F. Li
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20 May 2016, p. 183
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F13 Fundamental Parameter Method Using Scattering X-rays in X-ray Fluorescence Analysis
Y. Kataoka, N. Kawahara, S. Hara, Y. Yamada, T. Matsuo, M. Mantler
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20 May 2016, p. 183
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F41 Full Spectrum Calculations of EDXRF Spectra
W.T. Elam, B. Shen, B. Scruggs, J. Nicolosi
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20 May 2016, p. 183
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F48 Matrix Correction for Trace Element Analysis Using Mass Attenuation Coefficients
B. Vrebos, S. Milner, M. Ingham
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20 May 2016, p. 183
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F07 A New Approach for Quantitative Analysis in EDXRF Using Silicon Drift Detectors
J. Heckel
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20 May 2016, p. 183
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F16 Nanoliter Dried Spot Deposition Using an Automated Dispenser for MXRF Quantitative Analyses
E.P. Hastings, T. Miller, G.J. Havrilla
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20 May 2016, p. 183
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F60 Quantitative X-ray Fluorescence Analysis for Thick Sample by Fundamental Parameters
Y. Xiao
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20 May 2016, p. 183
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Page 9 of 11

Powder Diffraction

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Volume 20 - June 2005

Denver X-Ray Conference

D037 Quantitative Rietveld Analysis of Hydrated Cementitious Systems

F44 Alloy Characterization and Identification Using the Rubbing Technique with Micro X-ray Fluorescence

F45 Quantitative Analysis of Titanium-Rich Ores by X-ray Fluorescence

D051 Obtaining Reliable Results by Line Broadening Analysis—Invited

D089 X-ray Line Profile Analysis for Microstructural Characterization of Nanomaterials—Invited

D036 Investigating the Nature of Line Broadening in Electrochemically Deintercalated Li1.2Mn0.4Ni0.3Co0.1O2

D048 Analysis of Texture and Diffraction Data from Strong Neutron Absorbers

D053 Crystallographic Changes in Electrically Fatigued PZT Actuators

D090 SRM 1979: A Nist SRM for Nano-Crystallite Size Broadening—Invited

D003 Close Contact Penalty Functions in Direct Space Methods and Energetic Considerations in Structure Refinement

D095 Malachite-Rosasite Group: Evidence for Two Distinct Structural Types Through Rietveld Refinements

C11 Standardless XRF—Invited

F67 Optimization of Quantification Schemes for Contemporary Field-Portable XRF Analyzers—Invited

F01 Use of the Monte Carlo Simulation Code CEARXRF for the EDXRF Inverse Problem

F13 Fundamental Parameter Method Using Scattering X-rays in X-ray Fluorescence Analysis

F41 Full Spectrum Calculations of EDXRF Spectra

F48 Matrix Correction for Trace Element Analysis Using Mass Attenuation Coefficients

F07 A New Approach for Quantitative Analysis in EDXRF Using Silicon Drift Detectors

F16 Nanoliter Dried Spot Deposition Using an Automated Dispenser for MXRF Quantitative Analyses

F60 Quantitative X-ray Fluorescence Analysis for Thick Sample by Fundamental Parameters

Powder Diffraction

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Volume 20 - June 2005

Denver X-Ray Conference