Powder Diffraction: Volume 18 - Issue 2

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 18 - Issue 2 - June 2003

Contents

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Denver X-Ray Conference

D036 Combined X-ray and Neutron Diffraction Rietveld Refinements of Three-Layer Aurivillius Ceramics
M. S. Haluska, S. T. Misture
Published online by Cambridge University Press:

20 May 2016, p. 173
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D041 High Resolution X-ray Diffraction Studies of Epitaxially Grown GaN/SiC(0001) - Growth Conditions, Defect Density and Stress
N. Faleev, H. Temkin, I. Ahmad, M. Holtz, Yu. Melnik
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20 May 2016, p. 173
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F47 Performance and Application of Mirror-Based X-ray Fluorescence Microprobes at the Advanced Photon Source and the National Synchrotron Light Source — Invited
S. R. Sutton, M. Newville, P. Eng, M. Rivers, A. Lanzirotti
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20 May 2016, p. 173
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D040 Routine Texture Analysis of Neutron TOF Data Using the Rietveld Method
S. Vogel, R. B. Von Dreele, L. Lutterotti, H.-R. Wenk
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20 May 2016, p. 173
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“X-ray Scattering for Semiconductor Heterostructurex Analysis” - Invited
M. Goorsky
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20 May 2016, p. 173
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“From the Lab to The Fab: Automated High-Resolution X-ray Metrology for the Silicon Semiconductor Industry” - Invited
M. Wormington
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20 May 2016, p. 173
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D012 Investigation of the Mesoscopic Interface Structure of Thin Films with Diffuse X-ray Scattering
J. Stümpel, I. Busch
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20 May 2016, p. 173
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D092 Structural Characterization of SiGe and SiGe:C Heterostructures Using a Combination of X-ray Methods
J. F. Woitok
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20 May 2016, p. 173
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D118 Universal Theory for the Determination of both Screw and Edge Dislocation Densities for GAN and Related Materials Using High Resolution X-ray Diffraction
S. Bates
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20 May 2016, p. 173
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D121 Structure Investigations of Thin Films and Lateral Nanostructures by Means of X-ray Grazing Incidence Diffraction - Invited
J. Grenzer, U. Pietsch
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20 May 2016, p. 173
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D086 High-Resolution Grazing Incidence In-Plane Diffraction in the Laboratory
B. K. Tanner, T. P. A. Hase, T. A. Lafford, M. S. Goorsky
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20 May 2016, p. 173
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F13 Application of Fluorescent Microtomography and Other X-ray Fluorescence Techniques - Invited
A. Simionovici, B. Golosio, A. Somogyi, L. Lemelle
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20 May 2016, p. 174
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Characterization of Metalloprotein Metal Sites: High Throughput Approaches to Biological X-ray Absorption Spectroscopy - Invited
J. Penner-Hahn
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20 May 2016, p. 174
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C03 Observation of Atomic Arrangements in Si1-xGex Crystals by X-ray Fluorescence Holography
K. Hayashi, Y. Takahashi, E. Matsubara, I. Yonenaga
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20 May 2016, p. 174
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F35 Variation of PB and CA Concentration in Compact and Spongy Bone Determined by ΜSR-XRF at Hasylab, Beamline L
P. Wobrauschek, N. Zöger, G. Pepponi, C. Streli, G. Falkenberg, W. Osterode
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20 May 2016, p. 174
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D119 From Basic Science to New Flat Panel Displays: Solving the LC-Alignment Puzzle Using NEXAFS Spectroscopy - Invited
J. Lüning
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20 May 2016, p. 174
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F22 Recent Advances in High-Resolution Sources and High-Resolution Detectors for Soft X-ray Fluorescence Analysis: TXRF-NEXAFS and STJS - Invited
B. Beckhoff
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20 May 2016, p. 174
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F44 Improvements in Low-Power End-Window Transmission-Target X-ray Tubes
C. Jensen, S. D. Liddiard, A. Reyes-Mena, M. Moras, D. C. Turner, S. M. Elliott
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20 May 2016, p. 174
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C08 Status of Compact and Portable Laser-Compton Scattering Source at the Idaho Accelerator Center
K. Chouffani, D. Wells, F. Harmon, Y. Toyoda, J. Jones, G. Lancaster
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20 May 2016, p. 174
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C04 State-of-the-Art Silicon Detectors for X-ray Spectroscopy
P. Lechner, R. Hartmann, P. Holl, H. Soltau, N. Meidinger, G. Schaller, F. Schopper, L. Strüder, G. Lutz, R. H. Richter
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20 May 2016, p. 174
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Page 3 of 8

First
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1
2
3
4
5
6
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Last

Powder Diffraction

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Volume 18 - Issue 2 - June 2003

Denver X-Ray Conference

D036 Combined X-ray and Neutron Diffraction Rietveld Refinements of Three-Layer Aurivillius Ceramics

D041 High Resolution X-ray Diffraction Studies of Epitaxially Grown GaN/SiC(0001) - Growth Conditions, Defect Density and Stress

F47 Performance and Application of Mirror-Based X-ray Fluorescence Microprobes at the Advanced Photon Source and the National Synchrotron Light Source — Invited

D040 Routine Texture Analysis of Neutron TOF Data Using the Rietveld Method

“X-ray Scattering for Semiconductor Heterostructurex Analysis” - Invited

“From the Lab to The Fab: Automated High-Resolution X-ray Metrology for the Silicon Semiconductor Industry” - Invited

D012 Investigation of the Mesoscopic Interface Structure of Thin Films with Diffuse X-ray Scattering

D092 Structural Characterization of SiGe and SiGe:C Heterostructures Using a Combination of X-ray Methods

D118 Universal Theory for the Determination of both Screw and Edge Dislocation Densities for GAN and Related Materials Using High Resolution X-ray Diffraction

D121 Structure Investigations of Thin Films and Lateral Nanostructures by Means of X-ray Grazing Incidence Diffraction - Invited

D086 High-Resolution Grazing Incidence In-Plane Diffraction in the Laboratory

F13 Application of Fluorescent Microtomography and Other X-ray Fluorescence Techniques - Invited

Characterization of Metalloprotein Metal Sites: High Throughput Approaches to Biological X-ray Absorption Spectroscopy - Invited

C03 Observation of Atomic Arrangements in Si1-xGex Crystals by X-ray Fluorescence Holography

F35 Variation of PB and CA Concentration in Compact and Spongy Bone Determined by ΜSR-XRF at Hasylab, Beamline L

D119 From Basic Science to New Flat Panel Displays: Solving the LC-Alignment Puzzle Using NEXAFS Spectroscopy - Invited

F22 Recent Advances in High-Resolution Sources and High-Resolution Detectors for Soft X-ray Fluorescence Analysis: TXRF-NEXAFS and STJS - Invited

F44 Improvements in Low-Power End-Window Transmission-Target X-ray Tubes

C08 Status of Compact and Portable Laser-Compton Scattering Source at the Idaho Accelerator Center

C04 State-of-the-Art Silicon Detectors for X-ray Spectroscopy

Powder Diffraction

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Volume 18 - Issue 2 - June 2003

Denver X-Ray Conference