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F22 Recent Advances in High-Resolution Sources and High-Resolution Detectors for Soft X-ray Fluorescence Analysis: TXRF-NEXAFS and STJS - Invited

Published online by Cambridge University Press:  20 May 2016

B. Beckhoff
B. Beckhoff
Affiliation:
Physikalisch-Technische Bundesanstalt, Berlin, Germany
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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 18 , Issue 2 , June 2003 , pp. 174
Copyright
Copyright © Cambridge University Press 2003

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