Microscopy and Microanalysis: Volume 14 -

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Volume 14 - August 2008

Contents

Page 42 of 48

Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience

Research Article

Oxide Interfaces Under the Electron Microscope
M Varela, HM Christen, HN Lee, L Petit, T Schulthess, SJ Pennycook, W Luo, ST Pantelides, J Garcia-Barriocanal, C Leon, J Santamaria
Published online by Cambridge University Press:

03 August 2008, pp. 1346-1347
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Atomic Structure of Core-Shell Precipitates in Al-Li-Sc-Zr Alloys Studied by Analytical and Aberration-Corrected TEM/STEM
MD Rossell, R Erni, A Tolley, E Marquis, V Radmilovic, U Dahmen
Published online by Cambridge University Press:

03 August 2008, pp. 1348-1349
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Structural Characterization of WO3/ZrO2 Catalysts using HAADF Imaging
W Zhou, E Ross-Medgaarden, IE Wachs, CJ Kiely
Published online by Cambridge University Press:

03 August 2008, pp. 1350-1351
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Quantitative HAADF-STEM and EELS
JM LeBeau, SD Findlay, LJ Allen, S Stemmer
Published online by Cambridge University Press:

03 August 2008, pp. 1352-1353
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

EELS imaging of oxygen vacancy ordering
J Gazquez, M Varela, MP Oxley, MA Torija, M Sharma, C Leighton, SJ Pennycook
Published online by Cambridge University Press:

03 August 2008, pp. 1354-1355
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

High Energy-resolution EELS Studies on Electronic Excitations of LaB6 and Cs0.33WO3 Particles by using a Monochromator Transmission Microscope
Y Sato, M Terauchi, M Tanaka, M Mukai, T Kaneyama, K Adachi, T Asahi
Published online by Cambridge University Press:

03 August 2008, pp. 1356-1357
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Exciting Far-Ultraviolet Whispering Gallery Modes with High Energy Electrons
JK Hyun, M Couillard, PP Rajendran, C Liddell, DA Muller
Published online by Cambridge University Press:

03 August 2008, pp. 1358-1359
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Characterisation of the Optical Response of some Anisotropic Ternary Mn+1AXn Compounds
N Haddad, G Hug, E Garcia-Caurel, L Hultman, MW Barsoum
Published online by Cambridge University Press:

03 August 2008, pp. 1360-1361
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Plasmon Resonance Chemical Phase Mapping of Reactive Multilayers
MA Mat Yajid, T Wagner, G Möbus
Published online by Cambridge University Press:

03 August 2008, pp. 1362-1363
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Investigation of the Atomic Structures of Si3N4/CeO2-δ Interfaces using Atomic Resolution Z-contrast Imaging and EELS combined with First-Principles Methods
W Walkosz, R Klie, S Öǧüt, A Borisevich, P Becher, SJ Pennycook, JC Idrobo
Published online by Cambridge University Press:

03 August 2008, pp. 1364-1365
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Magnetic Linear Dichroism Probed by High Momentum Resolution EELS
Y Ito, NJ Zaluzec, AN Chiaramonti, RE Cook, M Van Veenendaal, DJ Miller
Published online by Cambridge University Press:

03 August 2008, pp. 1366-1367
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Elemental Mapping of Nanoscale Structures in the Aberration-Corrected Analytical Electron Microscope
A Herzing, IM Anderson, JK Edwards, AF Carley, GJ Hutchings, X Li, W Zhang, CJ Kiely
Published online by Cambridge University Press:

03 August 2008, pp. 1368-1369
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage
B Freitag, G Knippels, S Kujawa, M van der Stam, D Hubert, PC Tiemeijer, C Kisielowski, P Denes, A Minor, U Dahmen
Published online by Cambridge University Press:

03 August 2008, pp. 1370-1371
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Atomic Resolution Elemental Maps by Core Level EELS Using Cs Corrected STEM
E Okunishi, H Sawada, Y Kondo, M Kersker
Published online by Cambridge University Press:

03 August 2008, pp. 1372-1373
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

The Newly Installed Aberration Corrected and Dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory
H Inada, Y Zhu, J Wall, V Volkov, K Nakamura, M Konno, K Jarausch, RD Twesten
Published online by Cambridge University Press:

03 August 2008, pp. 1374-1375
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Performance of a Nion Co. UltraSTEMTM
P Wang, M Gass, M Falke, A Bleloch
Published online by Cambridge University Press:

03 August 2008, pp. 1376-1377
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Nanoscale Elemental Analysis by EELS in the Life Sciences
RD Leapman
Published online by Cambridge University Press:

03 August 2008, pp. 1378-1379
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

High Resolution Polymer Imaging Using Scanning Transmission Electron Microscopy
EI Garcia-Meitin, G Bar, J Blackson, D Reuschle
Published online by Cambridge University Press:

03 August 2008, pp. 1380-1381
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In Situ Measurements of Ni Oxidation Using Electron Energy-Loss Spectroscopy
P Rez, ES Moore, R Sharma
Published online by Cambridge University Press:

03 August 2008, pp. 1382-1383
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Elemental Mapping in Three Dimensions using 4D STEM-EELS Tomography
P Thomas, C Booth, R Harmon, S Markovic, RD Twesten, K Jarausch
Published online by Cambridge University Press:

03 August 2008, pp. 1384-1385
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 42 of 48

Microscopy and Microanalysis

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Volume 14 - August 2008

Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience

Research Article

Oxide Interfaces Under the Electron Microscope

Atomic Structure of Core-Shell Precipitates in Al-Li-Sc-Zr Alloys Studied by Analytical and Aberration-Corrected TEM/STEM

Structural Characterization of WO3/ZrO2 Catalysts using HAADF Imaging

Quantitative HAADF-STEM and EELS

EELS imaging of oxygen vacancy ordering

High Energy-resolution EELS Studies on Electronic Excitations of LaB6 and Cs0.33WO3 Particles by using a Monochromator Transmission Microscope

Exciting Far-Ultraviolet Whispering Gallery Modes with High Energy Electrons

Characterisation of the Optical Response of some Anisotropic Ternary Mn+1AXn Compounds

Plasmon Resonance Chemical Phase Mapping of Reactive Multilayers

Investigation of the Atomic Structures of Si3N4/CeO2-δ Interfaces using Atomic Resolution Z-contrast Imaging and EELS combined with First-Principles Methods

Magnetic Linear Dichroism Probed by High Momentum Resolution EELS

Elemental Mapping of Nanoscale Structures in the Aberration-Corrected Analytical Electron Microscope

First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage

Atomic Resolution Elemental Maps by Core Level EELS Using Cs Corrected STEM

The Newly Installed Aberration Corrected and Dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory

Performance of a Nion Co. UltraSTEMTM

Nanoscale Elemental Analysis by EELS in the Life Sciences

High Resolution Polymer Imaging Using Scanning Transmission Electron Microscopy

In Situ Measurements of Ni Oxidation Using Electron Energy-Loss Spectroscopy

Elemental Mapping in Three Dimensions using 4D STEM-EELS Tomography

Microscopy and Microanalysis

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Volume 14 - August 2008

Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience

Research Article