Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-12-03T00:48:30.739Z Has data issue: false hasContentIssue false
  • English
  • Français

The Newly Installed Aberration Corrected and Dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory

Published online by Cambridge University Press:  03 August 2008

H Inada ,
Y Zhu ,
J Wall ,
V Volkov ,
K Nakamura ,
M Konno ,
K Jarausch  and
RD Twesten
H Inada
Affiliation:
Hitachi High Technologies America
Y Zhu
Affiliation:
Brookhaven National Laboratory
J Wall
Affiliation:
Brookhaven National Laboratory
V Volkov
Affiliation:
Brookhaven National Laboratory
K Nakamura
Affiliation:
Hitachi High Technologies
M Konno
Affiliation:
Hitachi High Technologies
K Jarausch
Affiliation:
Hitachi High Technologies America
RD Twesten
Affiliation:
Gatan
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1374 - 1375
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)