Abstract
Testing the Reliability of Anatomical and Epidermical Characters in Grass Taxonomy
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- 03 October 2008, pp. 156-157
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Problem Solving Using Microanalytical Techniques
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Trace-element Analyses in Lunar Meteorite Sayh al Uhaymir 169
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- 03 August 2008, pp. 112-113
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Abstract
The Palynological Compass: A Case Study In Viticoideae (Vitex L.)
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- 03 October 2008, pp. 158-161
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40 Years of Energy Dispersive X-ray Spectrometry
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Impact of 40 Years of Technology Advances on EDS System Performance
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- 03 August 2008, pp. 114-115
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Abstract
Evaluating Structural Differences in Cortical Bone Tissue After Demineralization and Calcination
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- 03 October 2008, pp. 162-163
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40 Years of Energy Dispersive X-ray Spectrometry
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Results from Two Four-Channel Si-drift Detectors on an SEM: Conventional and Annular Geometries
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- 03 August 2008, pp. 116-117
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21st Century Scanning Microscopy - Electrons and He Ions
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Scanning Electron and Ion Microscope-based Size and Shape Metrology at the Nanometer Scale
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- 03 August 2008, pp. 118-119
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Backscattered Electron Imaging in the Scanning Electron Microscope: the Use of Either: (a) High Incident Energy or (b) an Array Detector
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- 03 August 2008, pp. 120-121
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Atom-Probe Analysis of Non-traditional Materials
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Cryopreparation for Interfacial Atom-Probe Analysis
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- 03 August 2008, pp. 122-123
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Advantages of Using a Digital Detector for Field Ion Microscopy
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- 03 August 2008, pp. 124-125
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New Analytical Techniques in Microbeam Analysis
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Numerical Calculation of Secondary Fluorescence Effects Near Phase Boundaries in EPMA
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- 03 August 2008, pp. 126-127
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Advances in Structure/Function Determination by Cryo-electron Microscopy
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Using molecular envelope information derived from SAXS and EM for cystallographic phasing
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- 03 August 2008, pp. 128-129
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Global Interactive Docking and Hessian Filtering for Multi-Resolution Fitting of Biomolecular Assemblies
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- 03 August 2008, pp. 130-131
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Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience
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Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy
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- 03 August 2008, pp. 132-133
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Application of Monochromated Electrons in EELS
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- 03 August 2008, pp. 134-135
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Atomic-Resolution STEM at 60kV Primary Voltage
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- 03 August 2008, pp. 136-137
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Lorentz Microscopy: A Versatile Technique for Studying Magnetic Multilayers, Elements and Nanowires
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Lorentz Microscopy: A Versatile Technique for Studying Magnetic Multilayers, Elements and Nanowires
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- 03 August 2008, pp. 138-139
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Microscopy Techniques for Ceramics and Composites
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Three Dimensional (3D) Visualization of Damage in Metal-Ceramic Nanolayers by Focused Ion Beam (FIB) Serial Sectioning
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- 03 August 2008, pp. 140-141
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Microstructural and Interface Analysis of Ceramic Eutectic Composites
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- 03 August 2008, pp. 142-143
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Imaging in Stem Cell Biology
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A Tubular Scaffold that Modulates Differentiation of Rat Bone Marrow Stem Cells
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- 03 August 2008, pp. 144-145
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