Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms

Abstract

TEM Investigation on Eutectic Phase Formation in Ni-30Cr Filler Metal 52XL

Structural Determination of GnGaC Nanolaminates by Electron Microscopy: Resistant Materials Under Thermal Damage

Identification of Chemical Dopants in YBa2Cu3O7-δ by Electron Probe Microanalyzer

Porous and Lamellar Molybdenum Oxide MonoCrystalline with Hexagonal Structure

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

The Growth Kinetics of Sucrose in Presence of Glucose in an Isothermal Continuous-Flow Reactor using a Photomicroscopic Method

Extracting Local Quantitative Atomic-resolution Strain Information from High-precision STEM Data of Supported Nanocatalysts

Identification of Rapid Oxygen Exchange Through Site-Dependent Cationic Displacements on CeO2 Nanoparticles

Revealing the Surface Effect at Atomic Scale in Silver Hollandite

Quantification of Structural Correlation in STEM Images using the Projected Pair Distribution Function

Deep Learning for Atomically Resolved Imaging

Unusual Structural Transformation in LiMn2O4 Cathode Revealed by Atomic-Scale STEM Characterization

Direct Imaging of Tilt Relaxation from the Interface in Epitaxially Strained Ca2RuO4 Thin Films using ABF-STEM

Atomistic Understanding of Interface Structures and Properties in Self-Assembled and Vertically Aligned Nanocomposite Thin Films by Advanced Scanning Transmission Electron Microscopy

Unique Line Defect Discovered in BaSnO3 Thin Film

High Resolution Scanning Transmission Electron Microscopy of Normal and Inverse Spinel Regions in Epitaxially Grown CoFe2O4

Decoding the Structural Origin of Piezoelectric and Thermoelectric Materials with Aberration-Corrected STEM

Roles of Oxygen Vacancy in Improper Ferroelectrics

Direct Visualization and Image Simulations of Oxygen Sublattice Occupancy in Thin Cuprate Films

Probing Jahn-Teller Distortions at Superconducting La2CuO4 Interfaces

Probing the Atomic Lattice Response of Quantum Materials Across Phase Transitions

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms

Abstract

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract