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Direct Imaging of Tilt Relaxation from the Interface in Epitaxially Strained Ca2RuO4 Thin Films using ABF-STEM

Published online by Cambridge University Press:  01 August 2018

Celesta S. Chang ,
Megan Holtz ,
Hari Nair ,
Jacob Ruf ,
Kyle Shen ,
Darrell Schlom  and
David Muller
Celesta S. Chang
Affiliation:
Physics Department, Cornell University, Ithaca NY, USA
Megan Holtz
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca NY, USA
Hari Nair
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca NY, USA
Jacob Ruf
Affiliation:
Physics Department, Cornell University, Ithaca NY, USA
Kyle Shen
Affiliation:
Physics Department, Cornell University, Ithaca NY, USA
Darrell Schlom
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca NY, USA
David Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca NY, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 64 - 65
Copyright
© Microscopy Society of America 2018 

References

[1] Friedt, O., et al, Phys. Rev. B 63 2000 174432.Google Scholar
[2] Backer, A. De, et al, Ultramic 171 2016) p 104.Google Scholar
[3] Treacy, M. M. J. Gibson, J. M. J. Vac. Sci. Technol. B 4(6 Nov/Dec 1986 1458.Google Scholar
[4] Gao, P., et al, Ultramic 184 2018 177.Google Scholar
[5] Funded by the Cornell Center for Materials Research Shared Facilities which are supported through the NSF MRSEC program (DMR-1719875) and NSF fellowship (DGE-1650441).Google Scholar