Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Quantitative and Qualitative Microanalysis by EPMA and SEM

Abstract

Pushing the XEDS Boundaries in Materials Research: Low Voltage XED Spectrum Imaging in the FEG-SEM

Comparing the Intensities and Spectral Resolution Achieved by Wavelength-Dispersive Spectrometers on Microprobes and SEMs.

SEM/EDS-Assisted LAM-ICPMS Analyses of Tourmaline of Tourmalinites Hosted in Serpentinites of the Paso Del Dragón Complex, Northeastern Uruguay

Development of a Reference Material for Image Sharpness Evaluation in Scanning Electron Microscopy

Introducing a New NIST Reference Material: Multiwall Carbon Nanotube Soot

Electrospun CeO2-ZnO Nanofibers Analyzed by Electron Probe Microanalyzer

Drainage Integration of the Salt and Verde Rivers in Arizona: Initial Insight from an Electron Microprobe Investigation of Basalts

Use of a Laser Engraver in Relocations and Sample Preparation for SEM and Light Microscope Analysis.

A SXES and CL Spectral Library for the Analysis of Rare Earth Elements

Advanced Scanning Diffraction: Mapping Functionality in Reciprocal Space at Nanometer Resolution

Abstract

Phase Contrast Imaging of Weakly-Scattering Samples with Matched Illumination and Detector Interferometry–Scanning Transmission Electron Microscopy (MIDI–STEM)

Enhanced Phase Contrast Transfer using Ptychography Combined with a Pre-Specimen Phase Plate in a Scanning Transmission Electron Microscope

Towards 3D electron ptychographic reconstruction

The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM

Mapping Of Nanoscale Structural Fluctuations In Ferroelectric BaTiO3Using STEM-CBED

Revealing Point Defects in a Large-Scale Scanning Diffraction Dataset

Reconstruction of Polarization Vortices by Diffraction Mapping of Ferroelectric PbTiO3 / SrTiO3 Superlattice Using a High Dynamic Range Pixelated Detector

Facilitating Quantitative Analysis of Atomic Scale 4D STEM Datasets

Towards Mapping Perovskite Oxide 3-D Structure Using Two-Dimensional Pixelated STEM Detector

An Electron Microscope Pixel Array Detector as a Universal STEM Detector

STEM Phase Imaging by Annular Pixel Array Detector (A-PAD) Combined with Quasi-Bessel Beam

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Quantitative and Qualitative Microanalysis by EPMA and SEM

Abstract

Advanced Scanning Diffraction: Mapping Functionality in Reciprocal Space at Nanometer Resolution

Abstract