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Use of a Laser Engraver in Relocations and Sample Preparation for SEM and Light Microscope Analysis.

Published online by Cambridge University Press:  25 July 2016

Abigail P. Lindstrom ,
Nicholas W.M. Ritchie  and
Michael Mengason
Abigail P. Lindstrom
Affiliation:
National Institute of Standards and Technology, Materials Measurement Laboratory, Gaithersburg, MD, 20899, USA
Nicholas W.M. Ritchie
Affiliation:
National Institute of Standards and Technology, Materials Measurement Laboratory, Gaithersburg, MD, 20899, USA
Michael Mengason
Affiliation:
National Institute of Standards and Technology, Materials Measurement Laboratory, Gaithersburg, MD, 20899, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 456 - 457
Copyright
© Microscopy Society of America 2016 

References

[1] Certain products, either public domain or commercial, are identified in this paper. Identification of such products does not imply recommendation or endorsement by NIST, nor does it imply that the identified product is the best available.Google Scholar
[2] NIST Relocate is available as component in the NIST DTSA-II installation. NIST DTSA-II is available for free download from www.cstl.nist.gov/div837/837.02/epq/dtsa2/index.html.Google Scholar