Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P10 Microscopy and Microanalysis for Real World Problem Solving

Abstract

Study of the phase equilibria in the L-alanine - sodium nitrate system by optical microscopy and X-ray powder diffraction

Microscopy Study of Morphological and Optical Changes in ZnO Nanostructures Induced by Pulsed Optical Excitation

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

TEM Characterization of a Mg2Si0.5Sn0.5 Solid Solution for High-Performance Thermoelectrics

Real-time Observation of Electrochemical Sodiation of C03O4/CNTS by in-situ Transmission Electron Microscopy

In Situ TEM Characterization of Nanostructured Dielectrics

Preparation of Electron and X-Ray Transparent Inorganic Particles for Analytical Microscopy Using the Ultramicrotome

Development of TEM techniques dedicated for characterization of energy related composites and its application

Investigation of Li ion and Multivalent Battery Systems Using In situ TEM and High Resolution EELS

Phase Transformation of Molybdenum Carbide in Carburization of MoS2 Studied by in-situ Environmental TEM

Real Structure and Structural Changes of Functional Tellurides

P12 Advanced Microanalysis and Microscopy of Soft and Hybrid Nanomaterials

Abstract

In Situ Electrochemical Deposition of Poly(3,4-ethylenedioxythiophene) (PEDOT)

Cryo-STEM Reveals Humidity-Controlled Shape Change in Silica Nanoparticles

Direct Conversion Biogas to Multiwall Carbon Nanotubes and Syngas over Starch Derived Ni@C Nanoparticles

The Biomineral-Cell Interface in the Sea Urchin Embryo

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

Automated cryo electron tomography and sub-tomogram averaging with the FEI Volta phase plate

In situ studies of cellular architecture by Electron Cryo-Tomography with Volta Phase Plate

Applications and New Investigations of the Volta Phase Plate

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

A Study of Gallium FIB induced Silicon Amorphization using TEM, APT and BCA Simulation

Probe Optimization studies For High current Focused Ion Beam Instruments

Methodology for Studying Nanoscale Details of Focused Ion Beam Gas-Assisted Etching and Deposition by TEM and Numerical Modeling

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P10 Microscopy and Microanalysis for Real World Problem Solving

Abstract

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

P12 Advanced Microanalysis and Microscopy of Soft and Hybrid Nanomaterials

Abstract

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract