Proceedings of Microscopy & Microanalysis 2016
Physical Science Symposia
Microscopy and Analysis in Forensic Science
Abstract
Advances in the Analysis of Gunshot Residue and Other Trace Evidence using EDS and EBSD in the SEM
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- 25 July 2016, pp. 2046-2047
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Quantitative Metrics for Classifying Candidate Gun-Shot Residue Particles
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- 25 July 2016, pp. 2048-2049
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Improving Worker Safety for Handling Nanomaterials at the Benchtop
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- 25 July 2016, pp. 2050-2051
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Analysis of Forensic Casework Utilizing Infrared Microspectroscopic Imaging
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- 25 July 2016, pp. 2052-2053
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Transmission Electron Microscopy and X-ray Photoelectron Spectroscopy Studies of Soot Particles Emitted from a Domestic Cook-stove
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- 25 July 2016, pp. 2054-2055
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The Application of Scanning Electron Microscopy with Energy Dispersive X-ray Spectroscopy (SEM-EDX) in Ancient Dental Calculus for the Reconstruction of Human Habits
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- 25 July 2016, pp. 2056-2057
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Elemental Analysis of Particles PM2.5 by SEM-EDS
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- 25 July 2016, pp. 2058-2059
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Technologist Forum, Tutorials and Outreach Symposia
Technologists’ Forum - Real Analysis Data Vs Artifact Recognition
Abstract
Artifacts In Cryo Preparation for Electron Microscopy
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- 25 July 2016, pp. 2060-2061
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Artifacts in Neuroimaging - Pitfalls in Volume Electron Microscopy for CLEM and in Freeze-Fracture Replica Immunogold Labeling -
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- 25 July 2016, pp. 2062-2063
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Technologists’ Forum - Special Topic: A Practical Approach to Current Software Solutions and Their Applications
Abstract
Performing Quantitative Imaging Acquisition, Analysis and Visualization Using the Best of Open Source and Commercial Software Solutions
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- 25 July 2016, pp. 2064-2065
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ImageJ: Image Analysis Interoperability for the Next Generation of Biological Image Data
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- 25 July 2016, pp. 2066-2067
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An Image Processing Workflow to Quantify Penetration of Blob-like Structures into an Arbitrary Region of Interest
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- 25 July 2016, pp. 2068-2069
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Advanced Platform for 3D Visualization, Reconstruction, and Segmentation with Electron Tomography
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- 25 July 2016, pp. 2070-2071
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A Digital Micrograph Script for Detection of Astigmatism in TEM Images
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- 25 July 2016, pp. 2072-2073
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Technologists’ Forum - Roundtable Discussion on Artifacts
Abstract
Recognizing and Preventing Artifacts in Microscopy: A Roundtable Discussion
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- 25 July 2016, pp. 2074-2075
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Career Tracks in Government and Industry
Abstract
Navigating the Job Market for Careers Inside and Outside of Academia.
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- 25 July 2016, pp. 2076-2077
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Effective Tactics for Getting an Equipment Grant
Abstract
Effective Tactics for Getting an Equipment Grant
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- 25 July 2016, pp. 2078-2079
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Building and Validating Atomic Models for EM Density Maps
Abstract
Building and Validating Atomic Models for Cryo-EM Density Maps
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- 25 July 2016, pp. 2080-2081
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Diffraction Mapping and 4D STEM
Abstract
Automated Analysis of Large Datasets Acquired with STEM Diffraction Mapping
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- 25 July 2016, pp. 2082-2083
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Compressive Sensing Applications in Microscopy
Abstract
Compressive Sensing in Microscopy: a Tutorial
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- 25 July 2016, pp. 2084-2085
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