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Automated Analysis of Large Datasets Acquired with STEM Diffraction Mapping

Published online by Cambridge University Press:  25 July 2016

Christoph Gammer
Christoph Gammer*
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA Physics of Nanostructured Materials, Faculty of Physics, University of Vienna, Austria

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 2082 - 2083
Copyright
© Microscopy Society of America 2016 

References

[1] Gammer, C., Ozdol, V.B., Liebscher, C.H. & Minor, A.M. Ultramicroscopy 155 (2015). p. 1.Google Scholar
[2] Zeng, Z., Zhang, X., Bustillo, K., Niu, K., Gammer, C., Xu, J. & Zheng, H. Nano Letters 15 (2015). p 5214.Google Scholar
[3] Ozdol, V.B., Gammer, C., Jin, X.G., Ercius, P., Ophus, C., Ciston, J. & Minor, A.M. Applied Physics Letters 106 (2015) 253107.Google Scholar
[4] The authors acknowledge support by the Austrian Science Fund (FWF):[J3397] and the Molecular Foundry, Lawrence Berkeley National Laboratory, which is supported by the U.S. Dept. of Energy under Contract # DE-AC02-05CH11231.Google Scholar