Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Vendor Symposium

Abstract

Cryo-EM Workflow Optimization

Tilt-free EBSD

The Benefits and Applications of a CMOS-based EBSD Detector

Introducing Lumis - A Novel EBSD Detector

Optimizing the Nion STEM for In-Situ Experiments

Sub-Å STEM Resolution From 30-300kV

Latest Developments in Environmental SEM Systems

Aquiring High-Quality Microscopic Images Through Silicon Without Damaging the Finished Product

Laser Scanning Confocal Microscopy 3D Surface Metrology Applications

Chromatic Line Confocal Sensor Technology in High-Speed 3D and Deep Depth of Focus 2D Imaging Applications

Insights on Sample Topography in EDX Spectroscopy with Annular SDD Detectors

An Evaluation of Beam-Damage Zone in Si Wafer Machined by Gatan MicroPREPTM Laser-Ablation

High Throughput Automatic Elemental Analysis System Using Conventional SEM-EDS

High Performance Silicon Drift Detectors for Energy Dispersive Spectroscopy

Using a Residual Gas Analyzer to Monitor Plasma Cleaning of SEM Chambers and Specimens

The Power of Electron Diffraction Phase Analysis and Pattern Simulations Using the ICDD® Powder Diffraction File™ (PDF-4+)

A 120 kV Transmission Electron Microscope Series for Both Life Science and Material Science Fields

Development of an Easy-to-Use Cryo-Electron Microscope for Simultaneous Observation of SEM and Transmission Images

Single Particle Analysis with Highly Coherent Electron Source from Cold Field Emission Gun

Biological Science Symposia

Microscopy and Analysis in Forensic Science

Abstract

The FBI Laboratory Toolmark Topography Analysis Research for Objectively Qualifying the Degree of Similarity between Toolmarks

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Vendor Symposium

Abstract

Biological Science Symposia

Microscopy and Analysis in Forensic Science

Abstract