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Mapping Chemical Bonds in Semiconductor Devices by Monitoring the Shifts of EELS Edges
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 5 / October 2017
- Published online by Cambridge University Press:
- 29 August 2017, pp. 926-931
- Print publication:
- October 2017
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- Article
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Compositional Imaging with Electron Energy Loss Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 1 / Issue 3 / June 1995
- Published online by Cambridge University Press:
- 08 August 2003, pp. 93-108
- Print publication:
- June 1995
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- Article
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