9 results
High Depth Resolution Auger Depth Profiling Analysis Using Inclined Holder
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 440-441
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- July 2010
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The Effect of Ca on the Reduction of CaO Doped FeO by Carbon
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 352-353
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- July 2010
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The intensity changes of ultra-soft X-ray spectra of several light element oxides
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1286-1287
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- August 2008
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Quantitative Evaluation of Auger Depth Profiles by LOGIT
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 26-27
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- August 2008
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Theoretical Study about Si L2,3 Spectra with The Cluster Calculation
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1446-1447
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- August 2007
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The Non-destructive Chemical State Analysis of Al-Cu Intermetallic Compound by Ultra-soft X-ray Spectrometer with Al L-alpha.
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 842-843
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- August 2007
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Electron Probe Microanalysis of Li K-alpha with Newly Developed Ultra-Soft X-ray Spectrometer
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 872-873
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- August 2006
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The Application of Micro Area Analysis of Al-Cu Junction by Wavelength-Dispersive EPMA Equipped with a FE Electron Gun.
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1420-1421
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- August 2006
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Development of Ultra-Soft X-ray Spectrometer for Electron Probe Microanalysis
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 58-59
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- August 2006
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