4 results
Multilevel memory and synaptic characteristics of a-IGZO thin-film transistor with atomic layer–deposited Al2O3/ZnO/Al2O3 stack layers
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- Journal:
- Journal of Materials Research / Volume 35 / Issue 7 / 14 April 2020
- Published online by Cambridge University Press:
- 25 November 2019, pp. 732-737
- Print publication:
- 14 April 2020
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Disaster Medicine in China: Present and Future
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- Journal:
- Disaster Medicine and Public Health Preparedness / Volume 12 / Issue 2 / April 2018
- Published online by Cambridge University Press:
- 28 June 2016, pp. 157-165
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X-ray reflectometry and spectroscopic ellipsometry characterization of Al2O3 atomic layer deposition on HF-last and NH3 plasma pretreatment Si substrates
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- Journal:
- Journal of Materials Research / Volume 22 / Issue 5 / May 2007
- Published online by Cambridge University Press:
- 03 March 2011, pp. 1214-1218
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- May 2007
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Structure Stability in Plasma Chemistry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 544 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 101
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- 1998
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