6 results
Low kV Analysis of the Atomic Structure and Bonding at Complex Oxide - Semiconductor Hetero-interfaces
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1626-1627
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- July 2012
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Low kV Analysis and First Principles Study of the Structure and Bonding at SrTiO3/GaAs Hetero-Interfaces
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1318-1319
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- July 2011
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Atomic and Electronic Structure of SrTiO3/GaAs Hetero-Interfaces
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1422-1423
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- July 2010
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Study of the Atomic Structures of Si3N4/CeO2-x and Si3N4/SiO2 Interfaces Using STEM and First-Principles Methods
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1014-1015
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- July 2009
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Direct Imaging of Light Elements in Aberration-Corrected Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1480-1481
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- July 2009
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Oxygen Segregation and Electronic Structure Changes at Dislocations in GaN
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 814-815
- Print publication:
- August 2003
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