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Direct Imaging of Light Elements in Aberration-Corrected Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  26 July 2009

JC Idrobo ,
MP Oxley ,
W Walkosz ,
RF Klie ,
S Ogut ,
B Mikijelj ,
SJ Pennycook  and
ST Pantelides
JC Idrobo
Affiliation:
Vanderbilt University
MP Oxley
Affiliation:
Vanderbilt University
W Walkosz
Affiliation:
University of Illinois,Chicago
RF Klie
Affiliation:
University of Illinois,Chicago
S Ogut
Affiliation:
University of Illinois,Chicago
B Mikijelj
Affiliation:
Ceradyne Inc
SJ Pennycook
Affiliation:
Vanderbilt University
ST Pantelides
Affiliation:
Vanderbilt University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1480 - 1481
Copyright
Copyright © Microscopy Society of America 2009