48 results
Marx et la politique du dehors Gavin Walker, traduit de l'anglais par Jonathan Martineau, Montréal: Lux Éditeur, 2022, pp. 456
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- Canadian Journal of Political Science/Revue canadienne de science politique / Volume 56 / Issue 1 / March 2023
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- 06 January 2023, pp. 237-238
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Phase Differentiation Based on X-ray Energy Spectrum Correlation with an Energy Dispersive Spectrometer (EDS)
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 602-603
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- August 2022
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Applications of a Triple Beam Microscope in Materials Science
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 22-23
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- August 2022
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Towards Quantitative Maps of Lithium in the Scanning Electron Microscope
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 566-568
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- August 2022
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Elemental Quantification and Experimental Measurement of Mean Free Path Using EELS and CBED at 30 keV
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 2744-2746
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- August 2022
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Characterization of Real Materials with Low Voltage STEM (30 kV): Current State and Challenges
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
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- 30 July 2021, pp. 1318-1320
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- August 2021
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Forward modeling of volume electron microscopy (vEM) of stained resin-embedded biological samples
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
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- 30 July 2021, pp. 776-777
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- August 2021
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EDS of Lithium Materials from 0.5 to 30 keV
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
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- 30 July 2021, pp. 1868-1869
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- August 2021
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Improving the Energy Resolution of Energy Dispersive Spectrometers(EDS) Using Richardson–Lucy Deconvolution
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
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- 30 July 2020, pp. 1210-1211
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- August 2020
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Secondary Fluorescence Correction for Quantitative X-ray Microanalysis Integrated in a User-Friendly Framework
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 500-502
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- August 2020
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Low-voltage STEM-EELS Quantification for Beam Sensitive Material Characterization
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1206-1208
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- August 2020
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Is a 30 kV CFE-SEM in STEM-in-SEM Mode Suitable for Characterizing Real Materials?
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1218-1219
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- August 2020
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Extract High Resolution 3D Quantitative Elemental Map Using a Combined HAADF-STEM and EDS Tomography
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1854-1855
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- August 2020
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Using Deep Learning to Deconvolute Complex Spectra for Hyperspectral Imaging Applications
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 178-179
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- August 2019
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Extending Monte Carlo Simulations of Electron Microscopy Images and Hyperspectral Images in a User-Friendly Framework
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 222-223
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- August 2019
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EELS Monitoring of Beam-Induced Dynamic Transformation of Lithium Materials at 30 keV
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 2168-2169
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- August 2019
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EELS Analysis of Bulk Plasmon Harmonics of Aluminium at 30 keV
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 464-465
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- August 2018
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Monte Carlo Simulation of Surface Semi-Spherical Inclusions Using MC X-ray
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 740-741
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- August 2018
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Methods for Simulation of Electron Energy Loss Spectra for Low Energy Edges in Battery Materials
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 440-441
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- August 2018
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Low Voltage Analytical Possibilities in a Scanning Electron Microscope in Transmission Mode at 30 kV: EDS, EELS and CBED at the Nanoscale
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 2036-2037
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- August 2018
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