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Secondary Fluorescence Correction for Quantitative X-ray Microanalysis Integrated in a User-Friendly Framework

Published online by Cambridge University Press:  30 July 2020

Yu Yuan ,
Hendrix Demers ,
Samantha Rudinsky ,
Nicolas Brodusch ,
Mathieu Gendron ,
Eric Yen ,
Sabrina Clusiau ,
Nicolas Piché  and
Raynald Gauvin
Yu Yuan
Affiliation:
McGill University, Montreal, Quebec, Canada
Hendrix Demers
Affiliation:
Centre d'excellence en électrification des transports et stockage d’énergie, Hydro-Québec, Varennes, Quebec, Canada
Samantha Rudinsky
Affiliation:
Steam Instruments, Montreal, Quebec, Canada
Nicolas Brodusch
Affiliation:
McGill University, Montreal, Quebec, Canada
Mathieu Gendron
Affiliation:
Object Research Systems, Montreal, Quebec, Canada
Eric Yen
Affiliation:
Object Research Systems, Montreal, Quebec, Canada
Sabrina Clusiau
Affiliation:
Object Research Systems, Montreal, Quebec, Canada
Nicolas Piché
Affiliation:
Object Research Systems, Montreal, Quebec, Canada
Raynald Gauvin
Affiliation:
McGill University, Montreal, Quebec, Canada

Abstract

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Type
Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 500 - 502
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Copyright
Copyright © Microscopy Society of America 2020

References

Goldstein, J. I., et al. , Scanning electron microscopy and X-ray microanalysis, Springer (2017).Google Scholar
Yuan, Y., et al. , Microscopy and Microanalysis (2020) (Under review).Google Scholar
Yuan, Y., et al. , Microscopy and Microanalysis 25 (1) (2019), p. 92–104.10.1017/S1431927618016215CrossRefGoogle Scholar
Gauvin, R. and Michaud, P, Microscopy and Microanalysis 15 (2009), p. 488–489.10.1017/S1431927609092423CrossRefGoogle Scholar
Rudinsky, S., et al. , Microscopy and Microanalysis 25 (S2)(2019): p.222–223.10.1017/S1431927619001843CrossRefGoogle Scholar
Piché, N., et al. , Microscopy and Microanalysis 24 (Suppl 1) (2018), p. 560–561.10.1017/S143192761800329XCrossRefGoogle Scholar