2 results
Characterization and Optimization of Semiconductor Specimen Preparation for QHREM
-
- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1204-1205
- Print publication:
- August 2002
-
- Article
-
- You have access
- Export citation
Layer and Defect Structures of BaF2/CaF2 Multilayers
-
- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1164-1165
- Print publication:
- August 2002
-
- Article
-
- You have access
- Export citation