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Nitrogen Gas Field Ion Source (GFIS) Focused Ion Beam (FIB) Secondary Electron Imaging: A First Look
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 4 / August 2017
- Published online by Cambridge University Press:
- 10 May 2017, pp. 758-768
- Print publication:
- August 2017
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Characteristics of Fielo-GaN Grown by Hydride Vapor Phase Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 639 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, G5.6
- Print publication:
- 2000
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- Article
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Bistability of Defects in Semiconductors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 378 / 1995
- Published online by Cambridge University Press:
- 26 February 2011, 929
- Print publication:
- 1995
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- Article
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