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Multiple Double Cross-Section Transmission Electron Microscope Sample Preparation of Specific Sub-10 nm Diameter Si Nanowire Devices
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 6 / December 2011
- Published online by Cambridge University Press:
- 10 November 2011, pp. 889-895
- Print publication:
- December 2011
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- Article
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