2 results
Focused Ion Beam Sample Preparation of Complex Devices
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 88-89
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation
High Resolution Sem Imaging of Multilayer Thin Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 382 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 207
- Print publication:
- 1995
-
- Article
- Export citation