20 results
EELS Probing of Lithium Based 2-D Battery Compounds Processed by Liquid Phase Exfoliation
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1984-1985
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- July 2017
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Development of magnetically active scaffolds as intrinsically-deformable bioreactors
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- MRS Communications / Volume 7 / Issue 3 / September 2017
- Published online by Cambridge University Press:
- 27 June 2017, pp. 367-374
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- September 2017
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Recent Applications of Sub-20meV Monochromated STEM-EELS: from Phonon to Core Losses in Real and Momentum Spaces
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 964-965
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- July 2016
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F-25 Advanced Pulse Processing and Analytical Methods for Quantitative Energy Dispersive XRF and Micro-EDXRF—Invited
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- Powder Diffraction / Volume 19 / Issue 2 / June 2004
- Published online by Cambridge University Press:
- 20 May 2016, p. 196
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F-13 Advantages and Disadvantages of Bayesian Methods for Obtaining XRF Net Intensities
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- Powder Diffraction / Volume 25 / Issue 2 / June 2010
- Published online by Cambridge University Press:
- 20 May 2016, p. 215
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F13 Fundamental parameters analysis of rohs elements in plastics
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- Powder Diffraction / Volume 21 / Issue 2 / June 2006
- Published online by Cambridge University Press:
- 20 May 2016, p. 173
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F41 Full Spectrum Calculations of EDXRF Spectra
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- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 20 May 2016, p. 183
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F-15 Improving Trace Element Detection in EDXRF by Reducing Pileup Artifacts
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- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 20 May 2016, p. 180
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F-9 Combined Multiple-Excitation FP Method For Micro-XRF Analysis of Difficult Samples
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- Powder Diffraction / Volume 24 / Issue 2 / June 2009
- Published online by Cambridge University Press:
- 20 May 2016, p. 170
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F-26 Micro-XRF Analysis of Thin Films and Coatings Using Fundamental Parameters
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- Powder Diffraction / Volume 19 / Issue 2 / June 2004
- Published online by Cambridge University Press:
- 20 May 2016, p. 196
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F05 Standardless FP Analysis of Thin Films and Multiple Layer Coatings
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- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 180
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F-7 Minimal Use of Standards for Quantifying Trace Elements in Plastics
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- Powder Diffraction / Volume 22 / Issue 2 / June 2007
- Published online by Cambridge University Press:
- 20 May 2016, p. 183
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Probing Atomic Scale Dynamics with STEM
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 104-105
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- August 2014
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Microstructural Characterization of Manganese Oxides Supercapacitors based on Liquid-phase Exfoliated for Energy Storage Applications
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1530-1531
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- August 2013
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Design and use of a prototype long-wavelength powder diffractometer
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- Powder Diffraction / Volume 8 / Issue 2 / June 1993
- Published online by Cambridge University Press:
- 10 January 2013, pp. 84-88
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Modeling High Count Rate EDS Analysis and its Effect on Analytical Uncertainties and Detection Limits
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1062-1063
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- July 2012
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Automated Qualitative Element Analysis of EDS Spectra with Considering Pile-Up Distortions in High Count-Rate Modes
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1192-1193
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- July 2011
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Processing and Aberration-Corrected Imaging of Novel Low-Dimensional Nanostructures
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 76-77
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- July 2010
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The Reduction of Pileup Effects in Spectra Collected with Silicon Drift Detectors
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1260-1261
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- August 2008
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Exfoliation of Mo6SxI9-x nanowires in common solvents
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- The European Physical Journal - Applied Physics / Volume 37 / Issue 2 / February 2007
- Published online by Cambridge University Press:
- 31 January 2007, pp. 149-159
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- February 2007
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