Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-09T15:38:32.493Z Has data issue: false hasContentIssue false

Modeling High Count Rate EDS Analysis and its Effect on Analytical Uncertainties and Detection Limits

Published online by Cambridge University Press:  23 November 2012

F. Eggert
Affiliation:
EDAX Inc., Ametek Materials Analysis, Mahwah, NJ
B. Anderhalt
Affiliation:
EDAX Inc., Ametek Materials Analysis, Mahwah, NJ
J. Nicolosi
Affiliation:
EDAX Inc., Ametek Materials Analysis, Mahwah, NJ
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)