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Resolving 45 pm with 300 kV Aberration Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 124-125
- Print publication:
- August 2014
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Ultraviolet (UV) Irradiation Effect on Minority-Carrier Recombination Lifetime in Silicon Wafers with Oxide and Nitride Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 318 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 471
- Print publication:
- 1993
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A Study of Surface and Subsurface Properties of Si (100) After Hydrogen ion-Beam Exposure
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- Journal:
- MRS Online Proceedings Library Archive / Volume 315 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 231
- Print publication:
- 1993
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Metallic Impurities in n- and p- Type Silicon: Dlts Studies
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- Journal:
- MRS Online Proceedings Library Archive / Volume 262 / 1992
- Published online by Cambridge University Press:
- 03 September 2012, 615
- Print publication:
- 1992
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Deep Level Energy Analysis of Surface and Bulk Defects Using a Noncontact Laser/Microwave Photoconductance Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 261 / 1992
- Published online by Cambridge University Press:
- 22 February 2011, 235
- Print publication:
- 1992
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Noncontact Characterization for Ultraviolet Light Irradiation Effect on Si-SiO2 Interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 262 / 1992
- Published online by Cambridge University Press:
- 26 February 2011, 1067
- Print publication:
- 1992
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