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Residual Stress Characterization on the Mesoscale in Additive Manufacturing
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 968-969
- Print publication:
- August 2018
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Characterization of SiGe Films for Use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905)
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 1 / February 2010
- Published online by Cambridge University Press:
- 24 December 2009, pp. 1-12
- Print publication:
- February 2010
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Refractive Index Measurements of Barium Titanate From .4 to 5.0 Microns and Implications for Periodically Poled Frequency Conversion Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 484 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 537
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- 1997
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