16 results
1 - Introduction to Electromigration
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- Electromigration in Metals
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- 12 May 2022, pp 1-7
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Contents
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- Electromigration in Metals
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- 12 May 2022, pp vii-x
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8 - Massive-Scale Statistical Studies for Electromigration
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- Electromigration in Metals
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- 12 May 2022, pp 338-379
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4 - Stress Evolution and Damage Formation in Confined Metal Lines under Electric Stressing
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- Electromigration in Metals
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- 12 May 2022, pp 80-126
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Copyright page
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- Electromigration in Metals
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- 12 May 2022, pp iv-iv
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Dedication
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- Electromigration in Metals
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- 12 May 2022, pp v-vi
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9 - Assessment of Electromigration Damage in Large On-Chip Power Grids
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- Electromigration in Metals
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- 12 May 2022, pp 380-413
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6 - Scaling Effects on Microstructure of Cu and Co Nanointerconnects
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- Electromigration in Metals
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- 12 May 2022, pp 203-250
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7 - Analysis of Electromigration-Induced Stress Evolution and Voiding in Cu Damascene Lines with Microstructure
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- Electromigration in Metals
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- 12 May 2022, pp 251-337
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5 - Electromigration in Cu Interconnect Structures
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- Electromigration in Metals
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- 12 May 2022, pp 127-202
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Index
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- Electromigration in Metals
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- 12 May 2022, pp 414-418
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Preface
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- Electromigration in Metals
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- 12 May 2022, pp xi-xiv
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2 - Fundamentals of Electromigration
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- Electromigration in Metals
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- 12 May 2022, pp 8-33
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3 - Thermal Stress Characteristics and Stress-Induced Void Formation in Aluminum and Copper Interconnects
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- Electromigration in Metals
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- 12 May 2022, pp 34-79
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![](https://assets.cambridge.org/97811070/32385/cover/9781107032385.jpg)
Electromigration in Metals
- Fundamentals to Nano-Interconnects
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- 05 May 2022
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- 12 May 2022
Cu CMP and its Challenge for 20nm Nodes and Beyond
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- MRS Online Proceedings Library Archive / Volume 1428 / 2012
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- 30 July 2012, mrss12-1428-c06-03
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- 2012
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