8 results
Flexible Grid Holder Enabling FIB-SEM Sample Prep and Analysis
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 162-163
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Advancing Materials Characterization in the FIB-SEM with Transmission Kikuchi Diffraction
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 326-327
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
A Method For In-Situ Measurement Of The Film Thickness And Composition Of Films Deposited by Gas Injection In The FIB-SEM
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 620-621
- Print publication:
- July 2012
-
- Article
- Export citation
In Situ Probe Approaches for Charge Reduction, Sample Manipulation, and Modified Total Release Lift-out
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 640-641
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
On-Probe Thinning of Samples for Bulk or STEM Type EDS Analysis
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 642-643
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Gas Assisted E-beam Lithography Using the JSM-7600F Ultra-High Resolution Schottky FEG-SEM and OmniGIS
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 58-59
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Sample Repositioning Solutions for in situ Preparation and Analysis
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 16-17
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Development of Novel Thin Film Deposition Methods in a CrossBeam® FIB-SEM Platform Using an OmniGISTM
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 990-991
- Print publication:
- August 2008
-
- Article
- Export citation