11 results
Raman Measurements of Epitaxial YBa2Cu3O7–δ Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 169 / 1989
- Published online by Cambridge University Press:
- 28 February 2011, 1017
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- 1989
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Structural and Magnetic Characterization of Rare Earth and Transition Metal Films Grown on Epitaxial Buffer Films on Semiconductor
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- Journal:
- MRS Online Proceedings Library Archive / Volume 151 / 1989
- Published online by Cambridge University Press:
- 03 September 2012, 203
- Print publication:
- 1989
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X-ray Diffraction Analysis of High Tc Superconducting Thin Films
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- Journal:
- Advances in X-ray Analysis / Volume 32 / 1988
- Published online by Cambridge University Press:
- 06 March 2019, pp. 269-278
- Print publication:
- 1988
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Orientation Relationships between BCC Deposits and FCC Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 94 / 1987
- Published online by Cambridge University Press:
- 25 February 2011, 127
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- 1987
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Formation of PtSi Using Polycrystalline Si and Different Annealing Sequences
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- Journal:
- MRS Online Proceedings Library Archive / Volume 106 / 1987
- Published online by Cambridge University Press:
- 22 February 2011, 175
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- 1987
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Characterization of Epitaxial Films by Grazing-Incidence X-Ray Diffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 77 / 1986
- Published online by Cambridge University Press:
- 26 February 2011, 151
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- 1986
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Characterization of Epitaxial Films by X-Ray Diffraction
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- Journal:
- Advances in X-ray Analysis / Volume 29 / 1985
- Published online by Cambridge University Press:
- 06 March 2019, pp. 353-366
- Print publication:
- 1985
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PtSi Contact Metallurgy by Different Formation Processes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 54 / 1985
- Published online by Cambridge University Press:
- 26 February 2011, 775
- Print publication:
- 1985
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Automated X-Ray Diffraction Laboratory System
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- Journal:
- Advances in X-ray Analysis / Volume 15 / 1971
- Published online by Cambridge University Press:
- 06 March 2019, pp. 114-122
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- 1971
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Procedures to Run an Automated Micro—Densitometer on a Shared Computer System
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- Journal:
- Advances in X-ray Analysis / Volume 14 / 1970
- Published online by Cambridge University Press:
- 06 March 2019, pp. 338-351
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- 1970
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Automated lattice Parameter Determination on Single Crystals
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- Journal:
- Advances in X-ray Analysis / Volume 13 / 1969
- Published online by Cambridge University Press:
- 06 March 2019, pp. 455-467
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- 1969
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